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Applied Physics A

, 123:760 | Cite as

Observation of an fcc–Co nanolayer grown between CoO and amorphous Si

  • D. Lenk
  • A. Ullrich
  • V. I. Zdravkov
  • R. Morari
  • A. S. Sidorenko
  • S. Horn
  • R. Tidecks
Article
  • 108 Downloads

Abstract

The thermodynamically crystallographic phase of Co at ambient conditions is hexagonal-close-packed. However, it has been found that given a crystallographic support from a suitable substrate, the high-temperature face-centered-cubic phase can be stabilized in thin films. We performed cross-sectional high-resolution transmission electron microscopy on a Si substrate/Si buffer/Co/CoO/Cu\(_{41}\)Ni\(_{59}\)/Nb/Cu\(_{41}\)Ni\(_{59}\)/Si-cap heterostructure (all layer thicknesses in the nanometer range). We analyzed lattice spacings and angles of the Co layer and neighbouring layers. While in the present study, there is no obvious support for an fcc structure by the amorphous Si buffer and the CoO (spinel structure), only an fcc phase of the Co layer (of about 5 nm thickness) is in agreement with the obtained results. However, the detailed mechanism of phase stabilization remains unresolved.

Notes

Acknowledgements

The authors are grateful to S. Heidemeyer, B. Knoblich, and W. Reiber for TEM sample preparation.

This work was supported by the Deutsche Forschungsgemeinschaft (DFG) under Grant No. HO 955/9-1.

The partial support by STCU (Grant No. 5982, A.S.S. and R.M.) is acknowledged.

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Copyright information

© Springer-Verlag GmbH Germany, part of Springer Nature 2017

Authors and Affiliations

  1. 1.Experimentalphysik II, Institut für PhysikUniversität AugsburgAugsburgGermany
  2. 2.D. Ghitsu Institute of Electronic Engineering and Nanotechnologies ASMKishinevMoldova

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