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Applied Physics A

, 122:231 | Cite as

Microstructure and thermochromic properties of VOX–WOX–VOX ceramic thin films

  • S. KhamsehEmail author
  • H. Araghi
  • M. Ghahari
  • M. A. Faghihi Sani
Article
  • 175 Downloads

Abstract

W-doped VO2 films have been synthesized via oxygen annealing of V–W–V (vanadium–tungsten–vanadium) multilayered films. The effects of middle layer’s thickness of V–W–V multilayered film on structure and properties of VOX–WOX–VOX ceramic thin films were investigated. The as-deposited V–W–V multilayered film showed amorphous-like structure when mixed structure of VO2 (M) and VO2 (B) was formed in VOX–WOX–VOX ceramic thin films. Tungsten content of VOX–WOX–VOX ceramic thin films increased with increasing middle layer’s thickness. With increasing middle layer’s thickness, room temperature square resistance (R sq) of VOX–WOX–VOX ceramic thin films increased from 65 to 86 kΩ/sq. The VOX–WOX–VOX ceramic thin film with the thinnest middle layer showed significant SMT (semiconductor–metal transition) when SMT became negligible on increasing middle layer’s thickness.

Keywords

Tungsten Oxide Multilayered Film Vanadium Oxide Tungsten Content Cerium Dioxide 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2016

Authors and Affiliations

  • S. Khamseh
    • 1
    Email author
  • H. Araghi
    • 2
  • M. Ghahari
    • 1
  • M. A. Faghihi Sani
    • 3
  1. 1.Department of Nanomaterial and NanocoatingsInstitute for Color Science and TechnologyTehranIran
  2. 2.Department of Materials Engineering, Science and Research BranchIslamic Azad UniversityTehranIran
  3. 3.Department of Materials Science and EngineeringSharif University of TechnologyTehranIran

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