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Photoinduced charge dissociation and transport at P3HT/ITO interfaces: studied by modulated surface spectroscopy

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Abstract

Results of a temperature dependence study of photoinduced charge separation across P3HT nanocrystals at P3HT/ITO interfaces have been investigated by modulated surface photovoltage (SPV) spectroscopy in a fixed capacitor arrangement. The SPV measurements were correlated with the crystalline sizes of P3HT nanocrystals determined by grazing incidence X-ray diffraction (GIXRD). The crystalline sizes of P3HT nanocrystals were varied systematically by progressive heating/cooling cycles identical for SPV and GIXRD measurements. Photovoltage signals, indication of photoinduced charge dissociation in space, at the P3HT/ITO interface were collected, and electrons were separated across the first monolayer of P3HT nanocrystals at the P3HT/ITO interface due to band bending. The activation energies for quenching of the in-phase and phase-shifted by 90° SPV signals were 0.7 and 0.6 eV, respectively. Thermal activation of the formation of P3HT nanocrystals was of the same order as the enthalpy of fusion of ideal crystals from regioregular P3HT. A schematic drawing of photoinduced charge separation at the P3HT/ITO is proposed.

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Acknowledgments

N.R. is grateful to the Higher Education Research Promotion and National Research University Project of Thailand, Office of the Higher Education Commission and to T.D. for financial support, to the University of Delaware for providing the infrastructure for GIXRD measurements at the Advanced Material Characterization Lab and to Gerald Poirer for technical support in the GIXRD measurements. T.S. is grateful to the Kasetsart University Research and Development Institute (L-M 8.58) for financial support.

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Rujisamphan, N., Supasai, T. & Dittrich, T. Photoinduced charge dissociation and transport at P3HT/ITO interfaces: studied by modulated surface spectroscopy. Appl. Phys. A 122, 77 (2016). https://doi.org/10.1007/s00339-016-9614-9

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