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Applied Physics A

, 122:1068 | Cite as

Controlled electromigration and oxidation of free-standing copper wires

  • J. S. Hauser
  • J. Schwichtenberg
  • M. MarzEmail author
  • C. Sürgers
  • A. Seiler
  • U. Gerhards
  • F. Messerschmidt
  • A. Hensel
  • R. Dittmeyer
  • H. v. Löhneysen
  • R. Hoffmann-Vogel
Article

Abstract

We have studied controlled electromigration (EM) in free-standing copper wires. Besides electrical characterization by voltage–current measurements, structural analyses have been performed by means of scanning electron microscopy and cross-sectional microprobe measurements. We have found that oxidation during the EM in air stabilizes the free-standing wire against uncontrolled blowing, making it possible to thin the conductive part of the wire down to a conductance of a few conductance quanta \(G_0=2e^2{/}h\). The decisive influence of oxidation by air on the EM process was confirmed by control experiments performed under ultra-high vacuum conditions. In line with these findings, free-standing Au wires were difficult to thin down reproducibly to a conductance of a few \(G_0\). Estimates of the local temperature in the free-standing wire are obtained from finite element method calculations.

Keywords

Cu2O Joule Heating Outer Ring Conductance Quantum Wire Cross Section 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgements

We thank S. Schneider for help with the SEM and C. Pérez León for useful discussions. M. Marz is grateful for support by the Alexander von Humboldt Foundation (Alexander von Humboldt-Stiftung). This work was supported by the ERC Starting Grant NANOCONTACTS (No. 239838) and by the Ministry of Science and Arts (BW), in the framework of its Schlieben-Lange program (Ministerium für Wissenschaft, Forschung und Kunst Baden-Württemberg).

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Copyright information

© Springer-Verlag Berlin Heidelberg 2016

Authors and Affiliations

  • J. S. Hauser
    • 1
  • J. Schwichtenberg
    • 1
  • M. Marz
    • 1
    Email author
  • C. Sürgers
    • 1
  • A. Seiler
    • 1
  • U. Gerhards
    • 2
  • F. Messerschmidt
    • 2
  • A. Hensel
    • 2
  • R. Dittmeyer
    • 2
  • H. v. Löhneysen
    • 1
    • 3
  • R. Hoffmann-Vogel
    • 1
    • 4
  1. 1.Physikalisches InstitutKarlsruhe Institute of TechnologyKarlsruheGermany
  2. 2.Institut für MikroverfahrenstechnikKarlsruhe Institute of TechnologyKarlsruheGermany
  3. 3.Institut für FestkörperphysikKarlsruhe Institute of TechnologyKarlsruheGermany
  4. 4.Institut für Angewandte PhysikKarlsruhe Institute of TechnologyKarlsruheGermany

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