Applied Physics A

, 122:1068 | Cite as

Controlled electromigration and oxidation of free-standing copper wires

  • J. S. Hauser
  • J. Schwichtenberg
  • M. Marz
  • C. Sürgers
  • A. Seiler
  • U. Gerhards
  • F. Messerschmidt
  • A. Hensel
  • R. Dittmeyer
  • H. v. Löhneysen
  • R. Hoffmann-Vogel
Article

Abstract

We have studied controlled electromigration (EM) in free-standing copper wires. Besides electrical characterization by voltage–current measurements, structural analyses have been performed by means of scanning electron microscopy and cross-sectional microprobe measurements. We have found that oxidation during the EM in air stabilizes the free-standing wire against uncontrolled blowing, making it possible to thin the conductive part of the wire down to a conductance of a few conductance quanta \(G_0=2e^2{/}h\). The decisive influence of oxidation by air on the EM process was confirmed by control experiments performed under ultra-high vacuum conditions. In line with these findings, free-standing Au wires were difficult to thin down reproducibly to a conductance of a few \(G_0\). Estimates of the local temperature in the free-standing wire are obtained from finite element method calculations.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2016

Authors and Affiliations

  • J. S. Hauser
    • 1
  • J. Schwichtenberg
    • 1
  • M. Marz
    • 1
  • C. Sürgers
    • 1
  • A. Seiler
    • 1
  • U. Gerhards
    • 2
  • F. Messerschmidt
    • 2
  • A. Hensel
    • 2
  • R. Dittmeyer
    • 2
  • H. v. Löhneysen
    • 1
    • 3
  • R. Hoffmann-Vogel
    • 1
    • 4
  1. 1.Physikalisches InstitutKarlsruhe Institute of TechnologyKarlsruheGermany
  2. 2.Institut für MikroverfahrenstechnikKarlsruhe Institute of TechnologyKarlsruheGermany
  3. 3.Institut für FestkörperphysikKarlsruhe Institute of TechnologyKarlsruheGermany
  4. 4.Institut für Angewandte PhysikKarlsruhe Institute of TechnologyKarlsruheGermany

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