Applied Physics A

, Volume 116, Issue 1, pp 379–387 | Cite as

Surface nanostructure effects on optical properties of Pb(Zr x Ti1−x )O3 thin films

  • Jarkko Puustinen
  • Jyrki Lappalainen
  • Jussi Hiltunen
  • Marianne Hiltunen
Article
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Abstract

Optical scattering properties of nanostructured matter have crucial impact on performance efficiency of various photonic components, such as waveguides, display elements, and solar cells. In this paper, diffuse transmission properties of nanocrystalline Pb(Zr x Ti1−x )O3 thin films with a high refractive index of ~2.5 and optical transmittance are presented. Thin films with a thicknesses ranging from 50 to 500 nm were studied using integrating sphere technique and results were compared to simulations performed by a scalar scattering theory. Thin films were deposited by pulsed laser deposition at room temperature on MgO(100) substrates and post-annealed at a temperature of 800 °C. Structural phase evolution-induced surface effects, which introduced periodicity on the film surface, cause the definite diffuse elements in transmission spectra of the films. Low and evenly distributed scattering amplitudes in k-space were seen for highly tetragonal- or trigonal-oriented films with non-textured surfaces, which led to low diffuse transmission values (T D ≈ 5 %), while confined and increased scattering amplitudes in k-space were seen for tetragonal–trigonal-oriented films, with phase co-existence, which led to microstructure-induced textured surfaces and increased diffuse transmission values (T D ≈ 50 %). For highly textured surfaces, scattering amplitudes distributed in tilted ellipsoid shape in k-space was observed. Difference between modeled and measured values was 3.8 % in maximum.

Keywords

Morphotropic Phase Boundary Atomic Force Microscopy Micrographs Diffuse Transmission Pupil Function Photonic Component 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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Notes

Acknowledgments

Author acknowledges Foundation of Riitta and Jorma J. Takanen for financial support. J. Hiltunen acknowledges Academy of Finland under grant 133814. Part of this research was carried out in Center of Microscopy and Nanotechnology.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2013

Authors and Affiliations

  • Jarkko Puustinen
    • 1
  • Jyrki Lappalainen
    • 1
  • Jussi Hiltunen
    • 2
  • Marianne Hiltunen
    • 2
  1. 1.Microelectronics and Materials Physics LaboratoriesUniversity of OuluOuluFinland
  2. 2.VTT Technical Research Centre of FinlandOuluFinland

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