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Applied Physics A

, Volume 112, Issue 4, pp 1073–1079 | Cite as

Laser-induced forward transfer of intact chalcogenide thin films: resultant morphology and thermoelectric properties

  • M. Feinaeugle
  • C. L. Sones
  • E. Koukharenko
  • B. Gholipour
  • D. W. Hewak
  • R. W. Eason
Article

Abstract

We present a laser-based transfer method for the novel application of fabricating elements for planar thermoelectric devices. Thin films of thermoelectric chalcogenides (Bi2Te3, Bi2Se3 and Bi0.5Sb1.5Te3) were printed via laser-induced forward transfer (LIFT) onto polymer-coated substrates over large areas of up to ∼15 mm2 in size. A morphological study showed that it was possible to partially preserve the polycrystalline structure of the transferred films. The films’ Seebeck coefficients after LIFT transfer were measured and resulted in −49±1 μV/K, −93±8 μV/K and 142±3 μV/K for Bi2Te3, Bi2Se3 and Bi0.5Sb1.5Te3, respectively, which were found to be ∼23±6 % lower compared to their initial values. This demonstration shows that LIFT is suitable to transfer sensitive, functional semiconductor materials over areas up to ∼15 mm2 with minimal damage onto a non-standard polymer-coated substrate.

Keywords

Bismuth Thermoelectric Property Bi2Te3 Seebeck Coefficient Thermoelectric Material 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgements

The research leading to these results has received funding from the e-LIFT project (no. 247868-FP7-ICT-2009-4), which is greatly acknowledged. Additional funding was received from the Engineering and Physical Sciences Research Council (EPSRC), UK, via grant number EP/J008052/1. We also want to greatly acknowledge Neil White to enable access to the Seebeck coefficient testing facilities, and Jonathan Butement and James Grant-Jacob for the technical advice in preparation of the receiver films.

References

  1. 1.
    D. Zhu, S. Beeby, J. Tudor, N. Harris, in PowerMEMS 2009, Washington, DC, USA (2009), pp. 201–204 Google Scholar
  2. 2.
    K.M. Saqr, M.N. Musa, Therm. Sci. 13, 165–174 (2009) CrossRefGoogle Scholar
  3. 3.
    G.J. Snyder, E.S. Toberer, Nat. Mater. 7, 105–114 (2008) ADSCrossRefGoogle Scholar
  4. 4.
    Organic Electronics Association, White Paper: OE-A Roadmap for Organic and Printed Electronics, 4th edn. (OE-A, 2011), pp. 76–106 Google Scholar
  5. 5.
    F.J. Adrian, J. Bohandy, B.F. Kim, A.N. Jette, P. Thompson, J. Vac. Sci. Technol., B Microelectron. Nanometer Struct. Process. Meas. Phenom. 5, 1490 (1987) ADSCrossRefGoogle Scholar
  6. 6.
    D.A. Willis, V. Grosu, Appl. Surf. Sci. 253, 4759–4763 (2007) ADSCrossRefGoogle Scholar
  7. 7.
    M. Domke, S. Rapp, M. Schmidt, H.P. Huber, Appl. Phys. A 109(2), 409–420 (2012). doi: 10.1007/s00339-012-7072-6 ADSCrossRefGoogle Scholar
  8. 8.
    T.C. Röder, J.R. Köhler, Appl. Phys. Lett. 100, 071603 (2012) ADSCrossRefGoogle Scholar
  9. 9.
    C.B. Arnold, P. Serra, A. Pique, Mater. Res. Soc. Bull. 32, 23–31 (2007) CrossRefGoogle Scholar
  10. 10.
    B. Hopp, T. Smausz, N. Kresz, N. Barna, Z. Bor, L. Kolozsvári, D.B. Chrisey, A. Szabó, A. Nógrádi, Tissue Eng. 11, 1817–1823 (2005) CrossRefGoogle Scholar
  11. 11.
    A. Doraiswamy, R.J. Narayan, T. Lippert, L. Urech, A. Wokaun, M. Nagel, B. Hopp, M. Dinescu, R. Modi, R.C.Y. Auyeung, D.B. Chrisey, Appl. Surf. Sci. 252, 4743–4747 (2006) ADSCrossRefGoogle Scholar
  12. 12.
    C. Germain, L. Charron, L. Lilge, Y.Y. Tsui, Appl. Surf. Sci. 253, 8328–8333 (2007) ADSCrossRefGoogle Scholar
  13. 13.
    G. Oosterhuis, B.H. in’t Veld, G. Ebberink, D.A. del Cerro, E. van den Eijnden, P. Chall, B. van der Zon, in 2010 IEEE Int. 3D Systems Integration Conf. (3DIC) (IEEE Press, New York, 2010), pp. 1–5 CrossRefGoogle Scholar
  14. 14.
    J. Shaw-Stewart, T. Lippert, M. Nagel, F. Nüesch, A. Wokaun, ACS Appl. Mater. Interfaces 3, 309–316 (2011) CrossRefGoogle Scholar
  15. 15.
    M. Christensen, A.B. Abrahamsen, N.B. Christensen, F. Juranyi, N.H. Andersen, K. Lefmann, J. Andreasson, C.R.H. Bahl, B.B. Iversen, Nat. Mater. 7, 811–815 (2008) ADSCrossRefGoogle Scholar
  16. 16.
    K. Kadel, L. Kumari, W.Z. Li, J.Y. Huang, P.P. Provencio, Nanoscale Res. Lett. 6, 1–7 (2010) Google Scholar
  17. 17.
    G.R. Elliott, G.S. Murugan, J.S. Wilkinson, M.N. Zervas, D.W. Hewak, Opt. Express 18, 26720–26727 (2010) ADSCrossRefGoogle Scholar
  18. 18.
    M.L. Tseng, B.H. Chen, C.H. Chu, C.M. Chang, W.C. Lin, N.N. Chu, M. Mansuripur, A.Q. Liu, D.P. Tsai, Opt. Express 19, 16975–16984 (2011) ADSCrossRefGoogle Scholar
  19. 19.
    W. Glatz, E. Schwyter, L. Durrer, C. Hierold, J. Microelectromech. Syst. 18, 763–772 (2009) CrossRefGoogle Scholar
  20. 20.
    E. Koukharenko, X. Li, I. Nandhakumar, N. Frety, S.P. Beeby, D. Cox, M.J. Tudor, B. Schiedt, C. Trautmann, A. Bertsch, N.M. White, J. Micromech. Microeng. 18, 104015 (2008) ADSCrossRefGoogle Scholar
  21. 21.
    M.F. Demirbas, Energy Sources 1, 85–95 (2006) CrossRefGoogle Scholar
  22. 22.
    T. Mattle, J. Shaw-Stewart, C.W. Schneider, T. Lippert, A. Wokaun, Appl. Surf. Sci. 258, 9352–9354 (2012) ADSCrossRefGoogle Scholar
  23. 23.
    M. Feinaeugle, A.P. Alloncle, P. Delaporte, C.L. Sones, R.W. Eason, Appl. Surf. Sci. 258, 8475–8483 (2012) ADSCrossRefGoogle Scholar
  24. 24.
    D.P. Banks, C. Grivas, J.D. Mills, R.W. Eason, I. Zergioti, Appl. Phys. Lett. 89, 193107 (2006) ADSCrossRefGoogle Scholar
  25. 25.
    J. Bohandy, B.F. Kim, F.J. Adrian, J. Appl. Phys. 60, 1538–1539 (1986) ADSCrossRefGoogle Scholar
  26. 26.
    Y. Feutelais, B. Legendre, N. Rodier, V. Agafonov, Mater. Res. Bull. 28, 591–596 (1993) CrossRefGoogle Scholar
  27. 27.
    M.Y. Pang, H.F. Lui, W.S. Li, K.H. Wong, C. Surya, J. Phys. Conf. Ser. 152, 012046 (2009) ADSCrossRefGoogle Scholar
  28. 28.
    H. Bottner, J. Nurnus, A. Gavrikov, G. Kuhner, M. Jagle, C. Kunzel, D. Eberhard, G. Plescher, A. Schubert, K.H. Schlereth, J. Microelectromech. Syst. 13, 414–420 (2004) CrossRefGoogle Scholar
  29. 29.
    A. Al Bayaz, A. Giani, A. Foucaran, E. Pascal-Delannoy, A. Boyer, Thin Solid Films 441, 1–5 (2003) ADSCrossRefGoogle Scholar
  30. 30.
    J. Kuleshova, E. Koukharenko, X.H. Li, N. Frety, I.S. Nandhakumar, J. Tudor, S.P. Beeby, N.M. White, Langmuir 26, 16980–16985 (2010) CrossRefGoogle Scholar
  31. 31.
    D. Bourgault, C.G. Garampon, N. Caillault, L. Carbone, J.A. Aymami, Thin Solid Films 516, 8579–8583 (2008) ADSCrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2012

Authors and Affiliations

  • M. Feinaeugle
    • 1
  • C. L. Sones
    • 1
  • E. Koukharenko
    • 2
  • B. Gholipour
    • 1
  • D. W. Hewak
    • 1
  • R. W. Eason
    • 1
  1. 1.Optoelectronics Research CentreUniversity of SouthamptonSouthamptonUK
  2. 2.School of Electronics and Computer ScienceUniversity of SouthamptonSouthamptonUK

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