Applied Physics A

, Volume 104, Issue 3, pp 829–837 | Cite as

Noble metal nanoparticles produced by nanosecond laser ablation

Article

Abstract

Silver and gold thin films were deposited by pulsed laser ablation in a controlled Ar atmosphere at pressures between 10 and 100 Pa. Different morphologies, ranging from isolated nanoparticle arrays up to nanostructured thin films were observed. Fast imaging of the plasma allowed deducing the expansion dynamics of the ablated plume. Plasma velocity and volume were used together with the measured average ablated mass per pulse as input parameters in a model to estimate the average size of nanoparticles grown in the plume. The nanoparticle size is expected to decrease from 4 nm down to 1 nm with decreasing Ar pressure between 100 and 10 Pa: this was confirmed by transmission electron micrographs which indicate a reduced dispersion of particle size over narrow size ranges. The production of substrates for surface enhanced Raman scattering whose performances critically depend on nanoparticle size, shape, and structure is discussed.

Keywords

Surface Enhance Raman Scatter Plasma Expansion Noble Metal Nanoparticles Transmission Electron Microscopy Picture Surface Enhance Raman Scatter Substrate 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    L. Patrone, D. Nelson, V.I. Safarov, M. Sentis, W. Marine, S. Giorgio, J. Appl. Phys. 87, 3829 (2000) ADSCrossRefGoogle Scholar
  2. 2.
    M. Bonelli, A. Miotello, P. Mosaner, P.M. Ossi, J. Appl. Phys. 93, 859 (2003) ADSCrossRefGoogle Scholar
  3. 3.
    D. Bolgiaghi, A. Miotello, P. Mosaner, P.M. Ossi, G. Radnoczi, Carbon 43, 2122 (2005) CrossRefGoogle Scholar
  4. 4.
    T. Yoshida, S. Takeyama, Y. Yamada, K. Mutoh, Appl. Phys. Lett. 68, 1772 (1996) ADSCrossRefGoogle Scholar
  5. 5.
    S. Amoruso, J. Schou, J.G. Lunney, Appl. Phys. A 92, 907 (2008) ADSCrossRefGoogle Scholar
  6. 6.
    O. Albert, S. Roger, Y. Glinec, J.C. Loulergue, J. Etchepare, C. Boumer-Leborgne, J. Perriere, E. Millon, Appl. Phys. A 76, 319 (2003) ADSCrossRefGoogle Scholar
  7. 7.
    X.T. Wang, B.Y. Man, G.T. Wang, Z. Zhao, B.Z. Xu, Y.Y. Zia, L.M. Mei, X.Y. Hu, J. Appl. Phys. 80, 1783 (1996) ADSCrossRefGoogle Scholar
  8. 8.
    Z. Zhang, P.A. VanRompay, J.A. Nees, P.P. Pronko, J. Appl. Phys. 92, 2867 (2002) ADSCrossRefGoogle Scholar
  9. 9.
    D.B. Geohegan, A.A. Puretzky, G.G. Duscher, S.J. Pennycook, Appl. Phys. Lett. 73, 438 (1998) ADSCrossRefGoogle Scholar
  10. 10.
    R. Messier, A.P. Giri, R. Roy, J. Vac. Sci. Technol. 2, 500 (1984) ADSCrossRefGoogle Scholar
  11. 11.
    P.M. Ossi, A. Bailini, Appl. Phys. A 93, 645 (2008) ADSCrossRefGoogle Scholar
  12. 12.
    E. Fazio, F. Neri, P.M. Ossi, N. Santo, S. Trusso, Radiat. Eff. Defects Solids 163, 673 (2008) ADSCrossRefGoogle Scholar
  13. 13.
    E. Fazio, F. Neri, P.M. Ossi, N. Santo, S. Trusso, Appl. Surf. Sci. 255, 9676 (2009) ADSCrossRefGoogle Scholar
  14. 14.
    E. Fazio, F. Neri, P.M. Ossi, N. Santo, S. Trusso, Laser Part. Beams 27, 281 (2009) ADSCrossRefGoogle Scholar
  15. 15.
    W.S. Rasband, ImageJ (US National Institutes of Health, Bethesda, 1997–2005). http://rsb.info.nih.gov/ij/ Google Scholar
  16. 16.
    C. D’Andrea, F. Neri, P.M. Ossi, N. Santo, S. Trusso, Nanotechnology 20, 245606 (2009) ADSCrossRefGoogle Scholar
  17. 17.
    A. Bailini, P.M. Ossi, A. Rivolta, Appl. Surf. Sci. 253, 7682 (2007) ADSCrossRefGoogle Scholar
  18. 18.
    P.E. Dyer, A. Issa, P.H. Key, Appl. Phys. Lett. 57, 186 (1990) ADSCrossRefGoogle Scholar
  19. 19.
    D.B. Geohegan, Appl. Phys. Lett. 60, 2732 (1992) ADSCrossRefGoogle Scholar
  20. 20.
    J. Gonzalo, C.N. Afonso, I. Madariaga, J. Appl. Phys. 81, 951 (1990) ADSCrossRefGoogle Scholar
  21. 21.
    A.V. Rode, E.G. Gamaly, B. Luther-Davies, Appl. Phys. A 70, 135 (2000) ADSCrossRefGoogle Scholar
  22. 22.
    A. Bailini, P.M. Ossi, Appl. Surf. Sci. 252, 4364 (2006) ADSCrossRefGoogle Scholar
  23. 23.
    F. Neri, P.M. Ossi, S. Trusso, Radiat. Eff. Defects Solids 165, 559 (2010) CrossRefGoogle Scholar
  24. 24.
    F. Neri, P.M. Ossi, S. Trusso, Laser Part. Beams 28, 53 (2010) ADSCrossRefGoogle Scholar
  25. 25.
    C. Vivien, J. Hermann, A. Perrone, Boulmer-Leborgne, A. Luches, J. Phys. D 31, 1263 (1998) ADSCrossRefGoogle Scholar
  26. 26.
    R.K. Thareja, R.K. Dwivedi, K. Ebihara, Nucl. Instrum. Methods Phys. Res., Sect. B, Beam Interact. Mater. Atoms 192, 301 (2002) ADSCrossRefGoogle Scholar
  27. 27.
    G. Dinescu, A. Aldea, M.L. De Giorgi, A. Luches, A. Perrone, A. Zocco, Appl. Surf. Sci. 127–129, 697 (1998) CrossRefGoogle Scholar
  28. 28.
    Z.W. Fu, Q.Z. Qin, M.F. Zhou, Appl. Phys. A 65, 445 (1997) ADSCrossRefGoogle Scholar
  29. 29.
    A. Savitzky, M.J.E. Golay, Anal. Chem. 36, 1627 (1964) ADSCrossRefGoogle Scholar
  30. 30.
    J. Fleishman, P.J. Hendra, A.J. McQuillan, Chem. Phys. Lett. 26, 163 (1974) ADSCrossRefGoogle Scholar
  31. 31.
    D.L. Jeanmarie, R.P. Van Duyne, J. Electroanal. Chem. 84, 1 (1977) CrossRefGoogle Scholar
  32. 32.
    M.G. Albrecht, J.A. Creighton, J. Am. Chem. Soc. 99, 5215 (1977) CrossRefGoogle Scholar
  33. 33.
    P. Hildebrandt, M. Stockburger, J. Phys. Chem. 88, 5935 (1984) CrossRefGoogle Scholar
  34. 34.
    E. Fazio, F. Neri, C. D’Andrea, P.M. Ossi, N. Santo, S. Trusso, J. Raman Spectrosc. (2011). doi: 10.1002/jrs.2861

Copyright information

© Springer-Verlag 2011

Authors and Affiliations

  1. 1.Dipartimento di EnergiaPolitecnico di MilanoMilanoItaly
  2. 2.Dipartimento di Fisica della Materia e Ingegneria ElettronicaUniversità di MessinaMessinaItaly
  3. 3.Centro Interdipartimentale Microscopia AvanzataUniversità degli Studi di MilanoMilanoItaly
  4. 4.CNR-IPCFIstituto per i Processi Chimico-FisiciMessinaItaly

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