Applied Physics A

, Volume 99, Issue 2, pp 433–436 | Cite as

On the contribution of secondary fluorescence to the Fe signal in proton-induced X-ray emission channeling measurements of Fe-doped GaN

Article
First Online:
Received:
Accepted:
  • 62 Downloads

Abstract

We present an experimental investigation of the contribution of secondary fluorescence to the iron signal in proton-induced X-ray emission (PIXE) channeling measurements of Fe-doped GaN layers. A method for the analysis of the PIXE angular scans has been developed, which is necessary for the correct quantification of the lattice site occupation of the Fe atoms in the GaN matrix. This approach should be taken into account any time the lattice location of small amounts of substitutional impurities has to be measured by PIXE channeling in analogous experimental conditions.

Keywords

PIXE channeling Iron GaN Secondary fluorescence 
This is a preview of subscription content, log in to check access.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    A. Bonanni, M. Kiecana, C. Simbrunner, T. Li, M. Sawicki, M. Wegscheider, M. Quast, H. Przybylińska, A. Navarro-Quezada, R. Jakieła, A. Wolos, W. Jantsch, T. Dietl, Phys. Rev. B 75, 125210 (2007) CrossRefADSGoogle Scholar
  2. 2.
    S. Heikman, S. Keller, S.P. DenBaars, U.K. Mishra, Appl. Phys. Lett. 81, 439 (2002) CrossRefADSGoogle Scholar
  3. 3.
    A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, S.J. Pearton, J. Vac. Sci. Technol. B 22, 120 (2004) CrossRefGoogle Scholar
  4. 4.
    T. Cesca, A. Gasparotto, G. Mattei, V. Rampazzo, F. Boscherini, B. Fraboni, F. Priolo, G. Ciatto, F. D’Acapito, C. Bocchi, Phys. Rev. B 68, 224113 (2003) CrossRefADSGoogle Scholar
  5. 5.
    C. Liu, E. Alves, A.D. Sequeira, N. Franco, M.F. da Silva, J.C. Soares, J. Appl. Phys. 90, 81 (2001) CrossRefADSGoogle Scholar
  6. 6.
    A. Seppala, J. Raisanen, Appl. Phys. Lett. 75, 820 (1999) CrossRefADSGoogle Scholar
  7. 7.
    S.A.E. Johansson, J.L. Campbell, PIXE: A Novel Technique for Elemental Analysis (Wiley, New York, 1988) Google Scholar
  8. 8.
    M. Berti, D. De Salvador, A.V. Drigo, F. Romanato, A. Sambo, S. Zerlauth, J. Stangl, F. Schaffler, G. Bauer, Nucl. Instr. Meth. Phys. Rev. B 143, 357 (1998) CrossRefADSGoogle Scholar

Copyright information

© Springer-Verlag 2010

Authors and Affiliations

  • T. Cesca
    • 1
  • A. Gasparotto
    • 1
  • S. Vangelista
    • 1
  • M. Berti
    • 1
  1. 1.Department of PhysicsUniversity of PadovaPadovaItaly

Personalised recommendations