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Applied Physics A

, Volume 92, Issue 1, pp 203–210 | Cite as

A non invasive method to detect stratigraphy, thicknesses and pigment concentration of pictorial multilayers based on EDXRF and vis-RS: in situ applications

  • L. Bonizzoni
  • S. Caglio
  • A. GalliEmail author
  • G. Poldi
Article

Abstract

Energy dispersive XRF analysis (EDXRF) in association with visible reflectance spectroscopy (vis-RS), both achieved by portable instruments, can be successfully applied, in a wide range of cases, to investigate wood or canvas paintings in order to obtain some stratigraphic information with non-invasive techniques. The specific aim of this work is to use them as quantitative tools: EDXRF to reconstruct the thicknesses of the detected layers, vis-RS to report pigment concentration in the uppermost layer. The method has been tested in the laboratory on paint layers with different composition of about 50 multilayers and more than 100 single layers [12]. We present here some in situ analyses of famous paintings by Andrea Mantegna and Giovanni Bellini, compared with stratigraphic optical microscopy observations on cross sections. Advantages and limits are pointed out.

Keywords

External Layer Pigment Concentration Paint Layer Lead White Blue Pigment 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag 2008

Authors and Affiliations

  1. 1.Istituto di Fisica Generale ApplicataUniversità degli Studi di MilanoMilanoItaly
  2. 2.Dipartimento di analisi scientifiche, Open CareMilanoItaly
  3. 3.CNR-INFM, Dipartimento di Scienza dei MaterialiUniversità degli Studi di Milano-BicoccaMilanoItaly
  4. 4.LANIAC, Università degli Studi di VeronaVeronaItaly

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