Comparison of electronic structures of mass-selected Ag clusters and thermally grown Ag islands on sputter-damaged graphite surfaces
Ag cluster anions consisting of 3–16 atoms were deposited on sputter-damaged HOPG surfaces using a soft-landing technique (mean deposition energy less than 0.2 eV/atom) at room temperature. For investigations of the structures of deposited clusters, X-ray photoelectron spectroscopy (XPS) and scanning tunneling microscopy (STM) were used. In addition, the chemical properties of deposited clusters were studied using atomic oxygen and CO. Comparison of the properties of deposited Ag clusters and Ag islands with similar sizes grown by evaporating Ag atoms on the same substrate shows different results, implying that two different preparation methods give either different shapes of Ag clusters and islands, or dissimilar metal–support interactions.
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