Applied Physics A

, Volume 86, Issue 2, pp 197–200 | Cite as

Structural characterization of shock-affected sapphire

  • M. Mazilu
  • S. Juodkazis
  • T. Ebisui
  • S. Matsuo
  • H. Misawa


The presence of dislocations has been revealed by numerical processing of high–resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 μm depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of ≃8×1012 cm-2.


Shock Wave Sapphire Dislocation Density Pulse Energy Fresnel Lens 
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Copyright information

© Springer-Verlag 2006

Authors and Affiliations

  • M. Mazilu
    • 1
  • S. Juodkazis
    • 2
  • T. Ebisui
    • 3
  • S. Matsuo
    • 3
  • H. Misawa
    • 2
  1. 1.SUPA, School of Physics and AstronomyUniversity of St. AndrewsSt. AndrewsUK
  2. 2.CREST-JST & Research Institute for Electronic ScienceHokkaido UniversitySapporoJapan
  3. 3.Ecosystem Engineering DepartmentThe University of TokushimaTokushimaJapan

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