Applied Physics A

, Volume 81, Issue 4, pp 721–723

Preparation and structural characterization of nanocrystalline SnO2 powders



Nanocrystalline SnO2 powders have been prepared by solid–liquid reaction and solid-state thermal oxidizing techniques. The microstructures and phase compositions of the product were characterized by thermogravimetry analysis, X-ray diffraction, and the Raman spectrum. It is shown that at least two phases, SnO2 and SnOx, coexist at 450 °C. However, only the tetragonal rutile structure SnO2 phase is detected after the Sn powders were annealed at 550 °C. The Raman peaks of the nanocrystalline SnO2 powders reveal remarkable red shift and broadening, which could be attributed to the phonon confinement effect, oxygen vacancies, and the stress effect.


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  1. 1.
    E.R. Leite, I.T. Weber, E. Longo, J.A. Varela, Adv. Mater. 12, 965 (2000)Google Scholar
  2. 2.
    P.H. Wei, G.B. Li, S.Y. Zhao, L.R. Chen, J. Electrochem. Soc. 146, 3536 (1999)Google Scholar
  3. 3.
    T.W. Kim, D.U. Lee, J.H. Lee, Y.S. Yoon, Solid State Commun. 115, 503 (2000)Google Scholar
  4. 4.
    S. Ferrere, A. Zaban, B.A. Gregg, J. Phys. Chem. B 101, 4490 (1997)Google Scholar
  5. 5.
    F. Gu, S.F. Wang, C.F. Song, M.K. Lu, Y.X. Qi, G.J. Zhou, D. Xu, D.R. Yuan, Chem. Phys. Lett. 372, 451 (2003)Google Scholar
  6. 6.
    Y.K. Liu, C.L. Zheng, W.Z. Wang, C.R. Yin, G.H. Wang, Adv. Mater. 13, 1883 (2001)Google Scholar
  7. 7.
    M.J. Zheng, G.H. Li, X.Y. Zhang, S.Y. Huang, Y. Lei, L.D. Zhang, Chem. Mater. 13, 3859 (2001)Google Scholar
  8. 8.
    Z.W. Pan, Z.R. Dai, Z.L. Wang, Science 291, 1947 (2001)Google Scholar
  9. 9.
    S.H. Sun, G.W. Meng, G.X. Zhang, T. Gao, B.Y. Geng, L.D. Zhang, J. Zuo, Chem. Phys. Lett. 376, 103 (2003)Google Scholar
  10. 10.
    J. Zuo, C.Y. Xu, X.M. Liu, C.S. Wang, C.Y. Wang, Y. Hu, Y.T. Qian, J. Appl. Phys. 75, 1835 (1994)Google Scholar
  11. 11.
    A. Dima, O. Dima, C. Moldovan, C. Cobianu, C. Savaniu, M. Zaharescu, Thin Solid Films 427, 427 (2003)Google Scholar
  12. 12.
    L. Sangaletti, L.E. Depero, B. Allieri, F. Pioselli, E. Comini, G. Sberveglieri, M. Zocchi, J. Mater. Res. 13, 2457 (1998)Google Scholar
  13. 13.
    A. Diéguez, A.R. Rodríguez, J.R. Morante, P. Nelli, L. Sangaletti, G.J. Sberveglieri, J. Electrochem. Soc. 146, 3527 (1999)Google Scholar
  14. 14.
    L. Abello, B. Bochu, A. Gaskov, S. Koudryavtseva, G. Lucazeau, M. Roumyantesva, J. Solid State Chem. 135, 78 (1998)Google Scholar
  15. 15.
    R.J. Nemanich, S.A. Solin, R.M. Martin, Phys. Rev. B 23, 6348 (1981)Google Scholar
  16. 16.
    I.H. Campbell, P.M. Fauchet, Solid State Commun. 58, 739 (1986)Google Scholar
  17. 17.
    J.C. Parker, R.W. Siegel, Appl. Phys. Lett. 57, 943 (1990)Google Scholar
  18. 18.
    F. Cerdeira, C.J. Buchenauer, F.H. Pollak, M. Cardona, Phys. Rev. B 5, 580 (1972)Google Scholar
  19. 19.
    Y. Du, W.L. Cai, C.M. Mo, J. Chen, L.D. Zheng, X.G. Zhu, Appl. Phys. Lett. 74, 2951 (1999)Google Scholar

Copyright information

© Springer-Verlag 2005

Authors and Affiliations

  • M.J. Zheng
    • 1
  • L. Ma
    • 1
  • W.L. Xu
    • 1
  • G.Q. Ding
    • 1
  • W.Z. Shen
    • 1
  1. 1.Laboratory of Condensed Matter Spectroscopy and Opto-Electronic Physics, Department of PhysicsShanghai Jiao Tong UniversityShanghaiChina

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