Applied Physics A

, Volume 81, Issue 2, pp 317–324 | Cite as

Femtosecond dynamics of dielectric films in the pre-ablation regime

Article

Abstract

The ultra-fast dynamics of dielectric oxide materials excited close to the laser-damage threshold is studied by performing transient reflection and transmission pump–probe measurements on TiO2, Ta2O5, and HfO2 films. The time-dependent dielectric constant is retrieved taking into account standing-wave effects of both pump and probe. A sub-100-fs transient is followed by a 1-ps transient, during which a sign reversal from negative to positive is observed in the real part of the induced change in the dielectric function, indicating the formation of deep defect states, possibly self-trapped excitons.

References

  1. 1.
    B.C. Stuart, M.D. Feit, S. Herman, A.M. Rubenchik, B.W. Shore, M.D. Perry, Phys. Rev. B 53, 1749 (1996)Google Scholar
  2. 2.
    M. Lenzner, J. Krüger, W. Kautek, F. Krausz, Appl. Phys. A 68, 369 (1999)Google Scholar
  3. 3.
    M.D. Perry, B.C. Stuart, P.S. Banks, M.D. Feit, V. Yanovsky, A.M. Rubenchik, J. Appl. Phys. 85, 6803 (1999)Google Scholar
  4. 4.
    A.P. Joglekar, H. Liu, G.J. Spooner, E. Meyhofer, G. Mourou, A.J. Hunt, Appl. Phys. B 77, 25 (2003)Google Scholar
  5. 5.
    M. Lenzner, J. Krüger, S. Santania, Z. Cheng, C. Spielmann, G. Mourou, W. Kautek, F. Krausz, Phys. Rev. Lett. 80, 4076 (1998)Google Scholar
  6. 6.
    A.-C. Tien, S. Backus, H. Kapteyn, M. Murnane, G. Mourou, Phys. Rev. Lett. 82, 3883 (1999)Google Scholar
  7. 7.
    A. Rosenfeld, M. Lorenz, R. Stoian, D. Ashkenasi, Appl. Phys. A 69, S373 (1999)Google Scholar
  8. 8.
    J. Jasapara, A.V.V. Nampoothiri, W. Rudolph, D. Ristau, K. Starke, Phys. Rev. B 63, 045117 (2001)Google Scholar
  9. 9.
    C.B. Schaffer, A. Brodeur, E. Mazur, Meas. Sci. Technol. 12, 1784 (2001)Google Scholar
  10. 10.
    M. Mero, J. Liu, W. Rudolph, D. Ristau, K. Starke, Phys. Rev. B (2005) in printGoogle Scholar
  11. 11.
    K.S. Song, R.T. Williams, Self-Trapped Excitons, 2nd edn. (Springer, Berlin, 1996)Google Scholar
  12. 12.
    P. Martin, S. Guizard, Ph. Daguzan, G. Petite, P. D’Oliveira, P. Meynadier, M. Perdrix, Phys. Rev. B 55, 5799 (1997)Google Scholar
  13. 13.
    M. Li, S. Menon, J.P. Nibarger, G.N. Gibson, Phys. Rev. Lett. 82, 2394 (1999)Google Scholar
  14. 14.
    J. Jasapara, M. Mero, W. Rudolph, Appl. Phys. Lett. 80, 2637 (2002)Google Scholar
  15. 15.
    D. Wei, Appl. Opt. 28, 2813 (1989)Google Scholar
  16. 16.
    J. Bonse, S. Baudach, J. Krüger, W. Kautek, K. Starke, T. Gross, D. Ristau, W. Rudolph, J. Jasapara, E. Welsch, in Proc. Laser-Induced Damage in Optical Materials 2000 [Proc. SPIE 4347, 24 (2001)]Google Scholar
  17. 17.
    M. Mero, J. Liu, A.J. Sabbah, J. Jasapara, K. Starke, D. Ristau, J.K. McIver, W. Rudolph, in Proc. Laser-Induced Damage in Optical Materials 2002 [Proc. SPIE 4932, 202 (2003)]Google Scholar
  18. 18.
    N. Peyghambarian, S.W. Koch, A. Mysyrowicz, Introduction to Semiconductor Optics (Prentice-Hall, Englewood Cliffs, New Jersey 1993)Google Scholar
  19. 19.
    E. Hendry, F. Wang, J. Shan, T.F. Heinz, M. Bonn, Phys. Rev. B 69, 081101 (2004)Google Scholar
  20. 20.
    F.C. Aris, T.J. Lewis, J. Phys. D: Appl. Phys. 6, 1067 (1973)Google Scholar
  21. 21.
    M.V. Klein, T.E. Furtak, Optics, 2nd edn. (Wiley, New York, 1986)Google Scholar
  22. 22.
    K. Sokolowski-Tinten, D. von der Linde, Phys. Rev. B 61, 2643 (2000)Google Scholar
  23. 23.
    G.E. Jellison, Jr., F.A. Modin, Appl. Phys. Lett. 69, 371 (1996); Erratum, Appl. Phys. Lett. 69, 2137 (1996)Google Scholar
  24. 24.
    P. Vashishta, R.K. Kalia, Phys. Rev. B 25, 6492 (1982)Google Scholar
  25. 25.
    A. Kaiser, B. Rethfeld, M. Vicanek, G. Simon, Phys. Rev. B 61, 11437 (2000)Google Scholar
  26. 26.
    D. Arnold, E. Cartier, D.J. DiMaria, Phys. Rev. B 45, 1477 (1992)Google Scholar
  27. 27.
    P.L. Young, J. Appl. Phys. 47, 242 (1976)Google Scholar
  28. 28.
    C. Itoh, K. Tanimura, N. Itoh, J. Phys. C: Solid State Phys. 21, 4693 (1988)ADSCrossRefGoogle Scholar
  29. 29.
    H. Tang, K. Prasad, R. Sanjines, P.E. Schmid, F. Levy, J. Appl. Phys. 75, 2042 (1994)Google Scholar
  30. 30.
    S. Guizard, P. Martin, G. Petite, P. D’Oliveira, P. Meynadier, J. Phys.: Condens. Matter 8, 1281 (1996)ADSCrossRefGoogle Scholar
  31. 31.
    O. Apel, K. Mann, A. Zoeller, R. Goetzelmann, E. Eva, Appl. Opt. 39, 3165 (2000)Google Scholar
  32. 32.
    A. Hertwig, S. Martin, J. Krüger, W. Kautek, Appl. Phys. A 79, 1075 (2004)Google Scholar

Copyright information

© Springer-Verlag 2005

Authors and Affiliations

  1. 1.Department of Physics and AstronomyUniversity of New MexicoAlbuquerqueUSA

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