Applied Physics A

, Volume 81, Issue 1, pp 65–70 | Cite as

Physico-chemical aspects of femtosecond-pulse-laser-induced surface nanostructures

Article

Abstract

Near-ablation threshold investigations focusing on the generation of periodic nanostructures and their correlation with physico-chemical properties of the solid phase such as e.g., the material-dependent surface energy, were conducted. Molecular dynamic modelling in the sub-picosecond time domain was used to consider ultrafast opto-electronic processes triggering surface reorganization reactions. Fluid containment of solid interfaces showed strong influence on the resulting micro- and nanostructures due to its drastic reduction of the surface energy. The phenomena are discussed in respect to the minimization of the surface free energy in dependence of material composition and interfacial structure.

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References

  1. 1.
    M. Birnbaum: J. Appl. Phys. 36, 3688 (1965)ADSMathSciNetCrossRefGoogle Scholar
  2. 2.
    D. Bäuerle: Laser Processing and Chemistry (Springer Verlag, Berlin, Heidelberg, New York 2000)Google Scholar
  3. 3.
    S. Küper, M. Stuke: Appl. Phys. B 44, 199 (1987)ADSCrossRefGoogle Scholar
  4. 4.
    W. Kautek, J. Krüger: SPIE Proceedings Vol. 2207, 600 (1994)ADSCrossRefGoogle Scholar
  5. 5.
    W. Kautek, S. Mitterer, J. Krüger, W. Husinsky, G. Grabner: Appl. Phys. A 58, 513 (1994)ADSCrossRefGoogle Scholar
  6. 6.
    J. Krüger, W. Kautek: Laser Phys. 9, 30 (1999)Google Scholar
  7. 7.
    J. Krüger, W. Kautek: Advances in Polymer Science, Vol. 168 (Springer Verlag, Heidelberg 2004), p. 247Google Scholar
  8. 8.
    W. Kautek, J. Krüger, M. Lenzner, S. Sartania, C. Spielmann, F. Krausz: Appl. Phys. Lett. 69, 3146 (1996)ADSCrossRefGoogle Scholar
  9. 9.
    M. Lenzner, J. Krüger, S. Sartania, Z. Cheng, C. Spielmann, G. Mourou, W. Kautek, F. Krausz: Phys. Rev. Lett. 80, 4076 (1998)ADSCrossRefGoogle Scholar
  10. 10.
    M. Lenzner, F. Krausz, J. Krüger, W. Kautek: Appl. Surf. Sci. 154, 11 (2000)ADSCrossRefGoogle Scholar
  11. 11.
    J. Krüger, W. Kautek: Appl. Surf. Sci 96, 430 (1996)ADSCrossRefGoogle Scholar
  12. 12.
    J. Krüger, P. Meja, M. Autric, W. Kautek: Appl. Surf. Sci. 186, 374 (2002)ADSCrossRefGoogle Scholar
  13. 13.
    G. Daminelli, P. Meja, A. Cortona, J. Krüger, M. Autric, W. Kautek: SPIE Proceedings Vol. 4760, 239 (2002)ADSCrossRefGoogle Scholar
  14. 14.
    F. Costache, M. Henyk, J. Reif: Appl. Surf. Sci. 186, 352 (2002)ADSCrossRefGoogle Scholar
  15. 15.
    J. Reif, F. Costache, M. Henyk, S.V. Pandelov: Appl. Surf. Sci. 197, 891 (2002)ADSCrossRefGoogle Scholar
  16. 16.
    F. Costache, M. Henyk, J. Reif: Appl. Surf. Sci. 208, 486 (2003)ADSCrossRefGoogle Scholar
  17. 17.
    J. Bonse, M. Geuss, S. Baudach, H. Sturm, W. Kautek: Appl. Phys. A 69, 399 (1999)ADSCrossRefGoogle Scholar
  18. 18.
    J. Bonse, P. Rudolph, J. Krüger, S. Baudach, W. Kautek: Appl. Surf. Sci. 154, 659 (2000)ADSCrossRefGoogle Scholar
  19. 19.
    J. Bonse, S. Baudach, J. Krüger, W. Kautek, M. Lenzner: Appl. Phys. A 74, 19 (2002)ADSCrossRefGoogle Scholar
  20. 20.
    H.O. Jeschke, M.E. Garcia, M. Lenzner, J. Bonse, J. Krüger, W. Kautek: Appl. Surf. Sci. 197, 839 (2002)ADSCrossRefGoogle Scholar
  21. 21.
    J. Bonse, K.-W. Brzezinka, A.J. Meixner: Appl. Surf. Sci. 221, 215 (2004)ADSCrossRefGoogle Scholar
  22. 22.
    F. Costache, S. Kouteva-Arguirova, J. Reif: Sol. St. Phen. 95, 635 (2004)CrossRefGoogle Scholar
  23. 23.
    J. Bonse, J.M. Wrobel, J. Krüger, W. Kautek: Appl. Phys. A 72, 89 (2001)ADSCrossRefGoogle Scholar
  24. 24.
    J. Bonse, J.M. Wrobel, K.-W. Brzezinka, N. Esser, W. Kautek: Appl. Surf. Sci. 202, 272 (2002)ADSCrossRefGoogle Scholar
  25. 25.
    J. Bonse, H. Sturm, D. Schmidt, W. Kautek: Appl. Phys. A 71, 657 (2000)ADSCrossRefGoogle Scholar
  26. 26.
    P. Rudolph, K.-W. Brzezinka, R. Wäsche, W. Kautek: Appl. Surf. Sci. 208, 285 (2003)ADSCrossRefGoogle Scholar
  27. 27.
    P. Rudolph, W. Kautek: Thin Solid Films 453, 537 (2004)ADSCrossRefGoogle Scholar
  28. 28.
    G. Daminelli, J. Krüger, W. Kautek: Thin Solid Films 467, 334 (2004)ADSCrossRefGoogle Scholar
  29. 29.
    A. Turchanin, W. Freyland: Chem. Phys. Lett. 387, 106 (2004)ADSCrossRefGoogle Scholar
  30. 30.
    A. Turchanin, W. Freyland, D. Nattland: Phys. Chem. Chem. Phys. 4, 647 (2002)CrossRefGoogle Scholar
  31. 31.
    J. Dogel, Fryland: Phys. Chem. Chem. Phys. 5, 2484 (2003)CrossRefGoogle Scholar
  32. 32.
    J.W. Cahn: J. Chem. Phys. 42, 93 (1965)ADSCrossRefGoogle Scholar
  33. 33.
    A. Ruf, F. Dausinger: In: Femtosecond Technology for Technical and Medical Applications, Topics Appl. Phys. 96, 105 (2004)Google Scholar
  34. 34.
    P. Debenedetti: Metastable liquids: Concepts and Principles (Princeton University Press, Princeton NJ 1996)Google Scholar
  35. 35.
    A.W. Adamson: Physical Chemistry of Surfaces (John Wiley & Sons, New York 1976)Google Scholar
  36. 36.
    W.D. Harkins: J.Chem. Soc. (London) A 62, 167 (1949)Google Scholar
  37. 37.
    W.D. Harkins: J.Chem. Soc. (London) A 63, 444 (1950)Google Scholar
  38. 38.
    R. Pampuch: Constitution and Properties of Ceramic Materials (Elsevier, Amsterdam, Oxford, New York, Tokyo 1991)Google Scholar
  39. 39.
    H.N.V. Temperley: Proc. Cambridge Phil. Soc. 48, 683 (1952)ADSMathSciNetCrossRefGoogle Scholar
  40. 40.
    W.K. Burton, N. Cabrera: Discuss. Faraday Soc. 5, 33 (1949)CrossRefGoogle Scholar
  41. 41.
    Online Materials Dataweb, www.MatWeb.comGoogle Scholar
  42. 42.
    R. Oltra, E. Arenholz, P. Leiderer, W. Kautek, C. Fotakis, M. Autric, C. Afonso, P. Wazen: SPIE Proceedings Vol. 3885, 499 (2000)ADSCrossRefGoogle Scholar
  43. 43.
    A. Cortona, W. Kautek: Phys. Chem. Chem. Phys. 3, 5283 (2001)CrossRefGoogle Scholar
  44. 44.
    W. Kautek, G. Daminelli: Electrochim. Acta 48, 3249 (2003)CrossRefGoogle Scholar
  45. 45.
    J. Noack, A. Vogel: IEEE J. Quant. Electron. 35, 1156 (1999)ADSCrossRefGoogle Scholar
  46. 46.
    K. Katayama, H. Yonecubo, T. Sawada: Appl. Phys. Lett. 82, 4244 (2003)ADSCrossRefGoogle Scholar

Copyright information

© Springer-Verlag 2005

Authors and Affiliations

  • W. Kautek
    • 1
    • 2
  • P. Rudolph
    • 2
  • G. Daminelli
    • 2
  • J. Krüger
    • 2
  1. 1.Institute for Physical ChemistryUniversity of ViennaViennaAustria
  2. 2.Laboratory for Thin Film TechnologyFederal Institute for Materials Research and TestingBerlinGermany

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