Applied Physics A

, Volume 81, Issue 6, pp 1207–1212 | Cite as

Direct characterization of nanoscale domain switching and local piezoelectric loops of (Pb,La)TiO3 thin films by piezoresponse force microscopy

  • R. PoyatoEmail author
  • M.L. Calzada
  • V.V. Shvartsman
  • A. Kholkin
  • P. Vilarinho
  • L. Pardo


〈111〉 and 〈001〉, 〈100〉 preferentially oriented lanthanum-modified lead titanate thin films have been studied at the nanometre scale by means of piezoresponse force microscopy. The nanoscale domain structures, domain switching, and local piezoelectric loops of the films have been analysed. The imaging of the domain structures after the application of a dc field suggests the existence of 90° and 180° domains within the regions with intermediate contrast. The variation of piezoresponse under an electric field in domains of two types has been discussed. Significant differences have been found between the local piezoelectric loops measured in the films deposited on different substrates. These differences are related to the different textures present in the films.


Microscopy Thin Film Titanate Operating Procedure Electronic Material 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Springer-Verlag 2004

Authors and Affiliations

  • R. Poyato
    • 1
    Email author
  • M.L. Calzada
    • 1
  • V.V. Shvartsman
    • 2
  • A. Kholkin
    • 2
  • P. Vilarinho
    • 2
  • L. Pardo
    • 1
  1. 1.Instituto de Ciencia de Materiales de Madrid (CSIC)MadridSpain
  2. 2.Departamento de Engenharia Cerâmica e do VidroUniversidade de AveiroAveiroPortugal

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