TEM Characterisation of YNi2B2C Thin Film Microstructure
- 30 Downloads
A thin film of the superconductor YNi2B2C deposited on an MgO(001) substrate by pulsed laser deposition has been investigated by transmission electron microscopy (TEM). Plan-view TEM analyses show that the YNi2B2C film consists of isolated rectangular grains distributed within a second phase. This phase was identified as the monoclinic phase Y2Ni15B6 with lattice parameters a=1.422 nm,b=1.067 nm,c=0.958 nm and β=95°. Additionally, the cubic phase Y2O3 with lattice constant a=1.06 nm was identified within the film.
KeywordsMicrostructure Microscopy Electron Microscopy Thin Film Transmission Electron Microscopy
Unable to display preview. Download preview PDF.
- 4.S.C. Wimbush, K. Häse, L. Schultz, B. Holzapfel: J. Phys.: Condens. Matter 13, L355 (2001)Google Scholar
- 8.A. Belger, G. Zahn, B. Wehner, P. Paufler, G. Graw, G. Behr: J. Alloys Compd. 26, 283 (1999)Google Scholar
- 9.I.B. Gubich, Y. B. Kuz’ma: Inorganic Materials 27, 916 (1991)Google Scholar
- 10.T. Glowiak, S.V. Orishin, I.B. Gubich, N.F. Chaban, Y. B. Kuz’ma: Sov. Phys. Crystallography (SPHCA) 34, 602 (1989)Google Scholar