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Applied Physics A

, Volume 81, Issue 3, pp 583–585 | Cite as

TEM Characterisation of YNi2B2C Thin Film Microstructure

  • G.H. Cao
  • P. Simon
  • W. Skrotzki
  • S.C. Wimbush
  • B. Holzapfel
Article

Abstract

A thin film of the superconductor YNi2B2C deposited on an MgO(001) substrate by pulsed laser deposition has been investigated by transmission electron microscopy (TEM). Plan-view TEM analyses show that the YNi2B2C film consists of isolated rectangular grains distributed within a second phase. This phase was identified as the monoclinic phase Y2Ni15B6 with lattice parameters a=1.422 nm,b=1.067 nm,c=0.958 nm and β=95°. Additionally, the cubic phase Y2O3 with lattice constant a=1.06 nm was identified within the film.

Keywords

Microstructure Microscopy Electron Microscopy Thin Film Transmission Electron Microscopy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag 2004

Authors and Affiliations

  • G.H. Cao
    • 1
  • P. Simon
    • 1
  • W. Skrotzki
    • 1
  • S.C. Wimbush
    • 2
  • B. Holzapfel
    • 2
  1. 1.Institute of Structural PhysicsTU DresdenDresdenGermany
  2. 2.IFW DresdenDresdenGermany

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