A TEM study of nanoparticles in lustre glazes
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Transmission electron microscopy (TEM) has been used to investigate the nanoscale morphology of some contemporary lustre glazes. High-resolution TEM, electron energy-loss spectroscopy and energy-dispersive X-ray analysis data imply that two kinds of nanoparticles are present in the lustre layer, namely metallic Ag and metallic Cu particles. Moreover, these particles appear separated in the material. The dense top layer consists of Ag particles and the particles occurring below this upper layer are metallic Cu. A depth profile of the sizes of the nanoparticles with respect to their penetration depths has been drawn. The particle sizes are mainly situated in the range of 5 nm to 15 nm, though smaller and larger particles occur frequently.
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