Applied Physics A

, Volume 78, Issue 6, pp 787–791 | Cite as

The nucleation of pentacene thin films

  • F.-J. Meyer zu Heringdorf
  • M.C. Reuter
  • R.M. Tromp
Article

Abstract

Photoemission Electron Microscopy was used to determine basic factors for nucleation and growth of thin pentacene films. Dependence of both substrate chemistry and deposition rate on the nucleation density was observed. On SiO2 pentacene shows a high nucleation density and forms small islands consisting of almost vertically oriented molecules. On Si(001) the nucleation density of this thin-film phase is much smaller, but the pentacene film first forms a flat-lying wetting layer. The thin-film phase only forms on top of this wetting layer. Adsorption of a cyclohexene self-assembled monolayer on Si(001) prior to the pentacene growth suppresses the initial pentacene wetting layer but maintains diffusion parameters similar to pentacene on Si(001). The nucleation of pentacene layers on cyclohexene/Si(001) can be described by classical nucleation theory with a critical nucleus size i≈6. Simple surface modification techniques such as e-beam irradiation of the substrates prior to pentacene adsorption can also have a significant effect on the pentacene nucleation density.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    Y. Lin, D. Gundlach, S. Nelson, T. Jackson: IEEE Electron Device Lett. 18, 606 (1997) ADSCrossRefGoogle Scholar
  2. 2.
    H. Klauk, D. Gundlach, M. Bonse, C. Kuo, T. Jackson: Appl. Phys. Lett. 76, 1692 (2000) ADSCrossRefGoogle Scholar
  3. 3.
    C. Dimitrakopoulos, S. Purushothaman, J. Kymissis, A. Callegari, J. Shaw : Science 283, 822 (1999) ADSCrossRefGoogle Scholar
  4. 4.
    I. Kymissis, C. Dimitrakopoulos, S. Purushothaman: IEEE Trans. Electron Devices 48, 1060 (2001) ADSCrossRefGoogle Scholar
  5. 5.
    H. Klauk, D.J. Gundlach, T.N. Jackson: IEEE Electron Device Lett. 20, 289 (1999) ADSCrossRefGoogle Scholar
  6. 6.
    F.J. Meyer zu Heringdorf, M. Reuter, R. Tromp: NATURE 412, 517 (2001) ADSCrossRefGoogle Scholar
  7. 7.
    R. Wyckoff: Crystal Structures: The Structure of Benzene Derivatives, Vol. 6 (Interscience 1971) Google Scholar
  8. 8.
    R. Campbell, J. Robertson, J. Trotter: Acta Cryst. 14, 705 (1961) CrossRefGoogle Scholar
  9. 9.
    C. Dimitrakopoulos, A. Brown, A. Pomp: J. Appl. Phys. 80, 2501 (1996) ADSCrossRefGoogle Scholar
  10. 10.
    M. Kasaya, H. Tabata, T. Kawai: Surf. Sci. 400, 367 (1998) ADSCrossRefGoogle Scholar
  11. 11.
    G. Hughes, J. Roche, D. Carty, T. Cafolla: J. Vac. Sci. Technol. B 20, 1620 (2002) Google Scholar
  12. 12.
    T. Witten, L. Sander: Phys. Rev. Lett. 47, 1400 (1981) ADSCrossRefGoogle Scholar
  13. 13.
    S. Lee, J. Hovis, S. Coulter, R. Hamers, C. Greenlief: Surf. Sci. 462, 6 (2000) ADSCrossRefGoogle Scholar
  14. 14.
    Y. Yamashita et al.: Appl. Surf. Sci. 169170, 172 (2001) Google Scholar
  15. 15.
    E. Bauer: Ultramicroscopy 17, 51 (1985) CrossRefGoogle Scholar
  16. 16.
    W. Telieps, E. Bauer: Ultramicroscopy 17, 57 (1985) CrossRefGoogle Scholar
  17. 17.
    C. Dimitrakopoulos, B. Furman, T. Graham, S. Hedge, S. Purushothaman: Synth. Met. 92, 47 (1998) CrossRefGoogle Scholar
  18. 18.
    R. Tromp, M. Mankos, M. Reuter, A. Ellis, M. Copel: Surf. Rev. Lett. 5, 1189 (1998) CrossRefGoogle Scholar
  19. 19.
    www.oriel.com: Tech. Info. for HG arc lamps Google Scholar
  20. 20.
    T. Yamaguchi: J. Phys. Soc. Jpn. 68, 1321 (1998) ADSCrossRefGoogle Scholar
  21. 21.
    P. Schroeder, C.B. France, J.B. Park, B.A. Parkinson: Appl. Phys. Lett. 91, 3010 (2002) Google Scholar
  22. 22.
    Z. Zhang, M. Lagally: Science 276, 377 (1997) CrossRefGoogle Scholar
  23. 23.
    J. Tersoff, A. van der Gon, R. Tromp: Phys. Rev. Lett. 72, 266 (1994) ADSCrossRefGoogle Scholar
  24. 24.
    J. Venables, G. Spiller, G. Hanbücken: Rep. Prog. Phys. 47, 399 (1984) ADSCrossRefGoogle Scholar
  25. 25.
    J. Evans, N. Bartelt: J. Vac. Sci. Technol. A 12, 1800 (1994) ADSCrossRefGoogle Scholar
  26. 26.
    W. Theiss, R. Tromp: Phys. Rev. Lett. 75, 2770 (1996) ADSCrossRefGoogle Scholar
  27. 27.
    R. Ruiz, B. Nickel, N. Koch, L.C. Feldman, R.F. Haglund (Jr.), A. Kahn, F. Family, G. Scoles: Phys. Rev. Lett. 91, 136102-4 (2003) ADSCrossRefGoogle Scholar
  28. 28.
    P. Schroeder, C. France, J. Park, B. Parkinson: J. Appl. Phys. 91, 3010 (2002) ADSCrossRefGoogle Scholar
  29. 29.
    F.J. Meyer zu Heringdorf, R. Tromp: unpublished Google Scholar

Copyright information

© Springer-Verlag 2004

Authors and Affiliations

  • F.-J. Meyer zu Heringdorf
    • 1
  • M.C. Reuter
    • 1
  • R.M. Tromp
    • 1
  1. 1.IBM T.J. Watson Research CenterYorktown HeightsUSA

Personalised recommendations