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Applied Physics A

, Volume 78, Issue 4, pp 483–489 | Cite as

Femtosecond time-resolved interferometric microscopy

  • V.V. Temnov
  • K. Sokolowski-Tinten
  • P. Zhou
  • D. von der Linde
Article

Abstract

We describe optical interferometry with 100 fs time resolution and a spatial resolution of approximately one micrometer. Using a pump-probe scheme and a 2D-Fourier transformation algorithm, we are able to retrieve from the interferograms very small changes in the phase and the amplitude of the reflected probe pulses. The performance of the technique is illustrated by measurements of transient and permanent surface modifications of crystalline GaAs after exposure to intense femtosecond laser pulses with fluences near the ablation threshold.

Keywords

Microscopy GaAs Laser Pulse Surface Modification Time Resolution 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag 2004

Authors and Affiliations

  • V.V. Temnov
    • 1
    • 2
  • K. Sokolowski-Tinten
    • 1
  • P. Zhou
    • 1
  • D. von der Linde
    • 1
  1. 1.Institut für Laser- und PlasmaphysikUniversität Duisburg-EssenEssenGermany
  2. 2.Institute of Applied PhysicsRussian Academy of ScienceNizhny NovgorodRussia

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