Applied Physics A

, Volume 78, Issue 1, pp 47–51 | Cite as

Lateral resolving power of a time-of-flight photoemission electron microscope

  • S.A. Nepijko
  • A. Oelsner
  • A. Krasyuk
  • A. Gloskovskii
  • N.N. Sedov
  • C.M. Schneider
  • G. Schönhense
Article

Abstract

The lateral resolution of a time-of-flight photoemission electron microscope has been theoretically analyzed. It has been shown that the resolution limit can reach a few nanometers. The lateral resolution will be higher if the photoelectrons forming the image are characterized by a smaller acceptance angle obtained with the help of diaphragms in the crossover plane, a higher initial energy and a narrower interval of electron energies. The experimental results are in good agreement with the theoretical predictions.

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Copyright information

© Springer-Verlag 2003

Authors and Affiliations

  • S.A. Nepijko
    • 1
    • 2
  • A. Oelsner
    • 1
  • A. Krasyuk
    • 1
  • A. Gloskovskii
    • 1
  • N.N. Sedov
    • 3
  • C.M. Schneider
    • 4
  • G. Schönhense
    • 1
  1. 1.Institute of PhysicsUniversity MainzMainzGermany
  2. 2.Institute of PhysicsNational Academy of Sciences of UkraineKievUkraine
  3. 3.The Moscow Military InstituteMoscowRussia
  4. 4.Institute of Solid State and Materials Research DresdenDresdenGermany

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