Fresenius' Journal of Analytical Chemistry

, Volume 357, Issue 4, pp 384–388 | Cite as

Use of microwave plasma torch atomic emission spectrometry for the determination of silicon

  • Feng Liang
  • Hanqi Zhang
  • Qun Jin
  • Daxin Zhang
  • Yahu Lei
  • Qinhan Jin
Original Paper Inorganic Analysis
Received:
Revised:
Accepted:

Abstract

A method for the elimination of matrix effects was developed for the determination of trace amounts of silicon by microwave plasma torch atomic emission spectrometry (MPT-AES). The sample solution was introduced into the MPT with a pneumatic nebulizer (PN). When Ar was used as both carrier and support gas, a detection limit of 10.8 ng/ml was obtained. The precision was 4.2% (RSD). The characteristics of the emission spectrum of silicon in MPT was studied in detail. The interference of some concomitant cations with the silicon emission was eliminated by incorporation of a cation-exchange column into the flow injection system. The method has been applied to analyze some practical samples and the results obtained are satisfactory.

Keywords

Adsorption Efficiency Anal Chim Mineral Water Sample Pneumatic Nebulizer Manifold System 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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Copyright information

© Springer-Verlag 1997

Authors and Affiliations

  • Feng Liang
    • 1
  • Hanqi Zhang
    • 1
  • Qun Jin
    • 1
  • Daxin Zhang
    • 1
  • Yahu Lei
    • 1
  • Qinhan Jin
    • 1
  1. 1.Department of ChemistryJilin UniversityChangchunP.R. China

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