N-K electron energy-loss near-edge structures for TiN/VN layers: an ab initio and experimental study
- 87 Downloads
- 9 Citations
Abstract
We study N-K-edge electron energy-loss near-edge structures for well-defined TiN/VN bilayers grown on a MgO(100) substrate by both calculations and experiments. The structural relaxations and the electronic structure of TiN/VN multilayers are calculated using the Vienna Ab Initio Simulation Package computer code, which uses density functional theory to describe the electronic interaction. The effects of the core hole created in the excitation process are included in the calculations. For VN, off-stoichiometric effects due to nitrogen vacancies are modelled. The partial density of states (PDOS) for the N-K edge of atoms in the vicinity of the TiN/MgO interface revealed that two new peaks appear between 7 and 9 eV instead of a broad shoulder typical for the bulk. For the VN/TiN interface, the PDOS is modified only slightly, owing to similar bonding on both sides of the interface, and is thus very similar to the respective bulk spectra. An experimental spectrum taken at the VN/TiN interface is, however, well described by an average of the simulated spectra for VN and TiN bulk (interface). Such a finding is characteristic of an intermixed interface.
Keywords
Spectroscopy/theory Interface/surface analysis Thin filmsNotes
Acknowledgement
This work was supported by the Austrian NANO Initiative via a grant from the Austrian Science Fund FWF within the project NanoInterfaces.
References
- 1.Toth L (1971) Transition metal carbides and nitrides. Academic, New YorkGoogle Scholar
- 2.Helmersson U, Todorova S, Barnett S, Sundgren JE, Markert L, Greene J (1978) J Appl Phys 62:481CrossRefGoogle Scholar
- 3.Yashar P, Sproul W (1999) Vacuum 55:179CrossRefGoogle Scholar
- 4.Münz WD (2003) MRS Bull 28:173Google Scholar
- 5.Lattela B, Gan B, Davies K, McKenzie D, McCulloch D (2006) Surf Coat Technol 200:3605CrossRefGoogle Scholar
- 6.Meidia H, Cullis A, Schönjahn C, Münz WD, Rodenburg J (2002) Surf Coat Technol 151–152:209CrossRefGoogle Scholar
- 7.Zhou Z, Rainforth W, Rother B, Ehiasarian A, Hovsepian P, Münz WD (2004) Surf Coat Technol 183:275CrossRefGoogle Scholar
- 8.Mayrhofer PH, Hovsepian P, Mitterer C, Münz WD (2004) Surf Coat Technol 177–178:341CrossRefGoogle Scholar
- 9.Zhou Z, Rainforth W, Lewis D, Creasy S, Forsyth J, Clegg F, Ehiasarian A, Hovsepian P, Münz WD (2004) Surf Coat Technol 177–178:198CrossRefGoogle Scholar
- 10.Kutschej K, Mayrhofer P, Kathrein M, Polcik P, Mitterer C (2004) Surf Coat Technol 188–189:358CrossRefGoogle Scholar
- 11.Gassner G, Mayrhofer P, Kutschej K, Mitterer C, Kathrein M (2004) Tribol Lett 17:751CrossRefGoogle Scholar
- 12.Rez P (1989) Ultramicroscopy 28:16CrossRefGoogle Scholar
- 13.Rashkova B, Lazar P, Redinger J, Podloucky R, Kothleitner G, Sturm S, Kutschej K, Mitterer C, Scheu C, Dehm G (2007) Int J Mater Res 98:(10) (in press)Google Scholar
- 14.Kutschej K, Rashkova B, Shen J, Mitterer C, Dehm G (2007) Thin Solid Films (in press)Google Scholar
- 15.Mitterbauer C, Kothleitner G, Grogger W, Zandbergen H, Freitag B, Tiemeijer P, Hofer F (2003) Ultramicroscopy 96(3–4):469CrossRefGoogle Scholar
- 16.Brink H, Barfels M, Burgner R, Edwards B (2003) Ultramicroscopy 96(3–4):367CrossRefGoogle Scholar
- 17.Egerton R (1986)Electron energy-loss spectroscopy in the electron microscope. Plenum, New YorkGoogle Scholar
- 18.Hohenberg P, Kohn W (1964) Phys Rev 136:864CrossRefGoogle Scholar
- 19.Kohn W, Sham L (1965) Phys Rev 140:1133CrossRefGoogle Scholar
- 20.Blöchl PE (1994) Phys Rev B 50:17953CrossRefGoogle Scholar
- 21.Kresse G, Joubert D (1999) Phys Rev B 59:1758CrossRefGoogle Scholar
- 22.Perdew JP, Wang Y (1992) Phys Rev B 45:13244CrossRefGoogle Scholar
- 23.Johansson B, Martensson N (1980) Phys Rev B 21:4427CrossRefGoogle Scholar
- 24.Lazar P, Redinger J, Podloucky R (2007) Phys Rev B 76:174112CrossRefGoogle Scholar
- 25.Blaha P, Schwarz K (1983) Int J Quantum Chem 23:1535CrossRefGoogle Scholar
- 26.Hofer P, Warbichler P, Scott A, Brydson R, Galesic I, Kolbesen B (2001) J Microsc 204:166CrossRefGoogle Scholar
