Analytical and Bioanalytical Chemistry

, Volume 387, Issue 3, pp 737–747 | Cite as

Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage

  • Manfred Schreiner
  • Michael Melcher
  • Katharina Uhlir
Review

Abstract

Scanning electron microscopy has been extensively used for the material characterization of objects of artistic and archaeological importance, especially in combination with energy dispersive X-ray microanalysis (SEM/EDX). The advantages and limitations of SEM/EDX are presented in a few case studies: analysis of pigments in cross-sections of paint layers, quantitative analysis of archaeological glass from the Roman period excavated in Ephesos/Turkey, and investigations on glasses with medieval composition concerning their weathering stability and degradation phenomena.

Keywords

Scanning electron microscopy (SEM) Energy dispersive analysis (EDX) Art analysis Pigment Glass Authentication Degradation Weathering 

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Copyright information

© Springer-Verlag 2006

Authors and Affiliations

  • Manfred Schreiner
    • 1
  • Michael Melcher
    • 1
  • Katharina Uhlir
    • 1
  1. 1.Institute of Science and Technology in ArtAcademy of Fine ArtsViennaAustria

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