Theoretical and Applied Genetics

, Volume 132, Issue 2, pp 501–513 | Cite as

Different loci associated with root and foliar resistance to sudden death syndrome (Fusarium virguliforme) in soybean

  • Ruijuan Tan
  • Paul J. Collins
  • Jie Wang
  • Zixiang Wen
  • John F. Boyse
  • Randall G. Laurenz
  • Cuihua Gu
  • Janette L. Jacobs
  • Qijian Song
  • Martin I. Chilvers
  • Dechun WangEmail author
Original Article


Key message

Different loci associated with root resistance to F. virguliforme colonization and foliar resistance to phytotoxin damage in soybean.


Use of resistant cultivars is the most efficacious approach to manage soybean sudden death syndrome (SDS), caused by Fusarium virguliforme. The objectives of this study were to (1) map the loci associated with root and foliar resistance to F. virguliforme infection and (2) decipher the relationships between root infection, foliar damage, and plot yield. A mapping population consisting of 153 F4-derived recombinant inbred lines from the cross U01-390489 × E07080 was genotyped by SoySNP6 K BeadChip assay. Both foliar damage and F. virguliforme colonization in roots were investigated in the field, and a weak positive correlation was identified between them. Foliar damage had a stronger negative correlation with plot yield than F. virguliforme colonization. Twelve loci associated with foliar damage were identified, and four of them were associated with multiple traits across environments. In contrast, only one locus associated with root resistance to F. virguliforme colonization was identified and mapped on Chromosome 18. It colocalized with the locus associated with foliar damage in the same environment. The locus on Chromosome 6, qSDS6-2, and the locus on Chromosome 18, qSDS18-1, were associated with resistance to SDS phytotoxins and resistance to F. virguliforme colonization of roots, respectively. Both loci affected plot yield. Foliar damage-related traits, especially disease index, are valuable indicators for SDS resistance breeding because of consistency of the identified loci and their stronger correlation with plot yield. The information provided by this study will facilitate marker-assisted selection to improve SDS resistance in soybean.



This work was supported by North Central Soybean Research Program, Michigan Soybean Promotion Committee, USDA National Institute of Food and Agriculture, Hatch project 1011788 and MSU AgBioResearch. We thank George L. Graef from the Department of Agronomy and Horticulture at the University of Nebraska–Lincoln for providing one of the parental lines, U01-390489. We thank Adam Byrne, Yingdong Bi, Shichen Zhang, Wenyan Du, Jiazheng Yuan, Lihong Li, Wei Xiao, and Zhimin Dong for assistance during the conduction of this research. This study was reviewed by Dr. James Kelly and Dr. Amy Iezzoni from Michigan State University.

Compliance with ethical standards

Conflict of interest

On behalf of all authors, the corresponding author states that there is no conflict of interest.

Ethical standards

This work complies with the current law of the USA.

Supplementary material

122_2018_3237_MOESM1_ESM.pdf (1.8 mb)
Supplementary material 1 (PDF 1823 kb)


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Copyright information

© Springer-Verlag GmbH Germany, part of Springer Nature 2018

Authors and Affiliations

  • Ruijuan Tan
    • 1
  • Paul J. Collins
    • 1
  • Jie Wang
    • 2
  • Zixiang Wen
    • 1
  • John F. Boyse
    • 1
  • Randall G. Laurenz
    • 1
  • Cuihua Gu
    • 1
  • Janette L. Jacobs
    • 1
  • Qijian Song
    • 3
  • Martin I. Chilvers
    • 1
  • Dechun Wang
    • 1
    Email author
  1. 1.Department of Plant, Soil and Microbial SciencesMichigan State UniversityEast LansingUSA
  2. 2.Department of Plant BiologyMichigan State UniversityEast LansingUSA
  3. 3.Soybean Genomics and Improvement Laboratory, Agricultural Research ServiceUnited States Department of AgricultureBeltsvilleUSA

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