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Theoretical and Applied Genetics

, Volume 125, Issue 6, pp 1253–1262 | Cite as

QTL mapping of adult-plant resistances to stripe rust and leaf rust in Chinese wheat cultivar Bainong 64

  • Yan Ren
  • Zaifeng Li
  • Zhonghu He
  • Ling Wu
  • Bin Bai
  • Caixia Lan
  • Cuifen Wang
  • Gang Zhou
  • Huazhong Zhu
  • Xianchun Xia
Original Paper

Abstract

Stripe rust and leaf rust, caused by Puccinia striiformis Westend. f. sp. tritici Erikss. and P. triticina, respectively, are devastating fungal diseases of common wheat (Triticum aestivum L.). Chinese wheat cultivar Bainong 64 has maintained acceptable adult-plant resistance (APR) to stripe rust, leaf rust and powdery mildew for more than 10 years. The aim of this study was to identify quantitative trait loci/locus (QTL) for resistance to the two rusts in a population of 179 doubled haploid (DH) lines derived from Bainong 64 × Jingshuang 16. The DH lines were planted in randomized complete blocks with three replicates at four locations. Stripe rust tests were conducted using a mixture of currently prevalent P. striiformis races, and leaf rust tests were performed with P. triticina race THTT. Leaf rust severities were scored two or three times, whereas maximum disease severities (MDS) were recorded for stripe rust. Using bulked segregant analysis (BSA) and simple sequence repeat (SSR) markers, five independent loci for APR to two rusts were detected. The QTL on chromosomes 1BL and 6BS contributed by Bainong 64 conferred resistance to both diseases. The loci identified on chromosomes 7AS and 4DL had minor effects on stripe rust response, whereas another locus, close to the centromere on chromosome 6BS, had a significant effect only on leaf rust response. The loci located on chromosomes 1BL and 4DL also had significant effects on powdery mildew response. These were located at the same positions as the Yr29/Lr46 and Yr46/Lr67 genes, respectively. The multiple disease resistance locus for APR on chromosome 6BS appears to be new. All three genes and their closely linked molecular markers could be used in breeding wheat cultivars with durable resistance to multiple diseases.

Keywords

Powdery Mildew Simple Sequence Repeat Marker Doubled Haploid Leaf Rust Stripe Rust 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgments

We are grateful to the critical review of this manuscript by Prof. R. A. McIntosh, Plant Breeding Institute, University of Sydney, Australia. This study was supported by the China Agriculture Research System (CARS-3-1-3), International Collaboration Project from the Ministry of Agriculture (2011-G3), National 863 project (2012AA101105) and National Natural Science Foundation of China (30821140351).

Supplementary material

122_2012_1910_MOESM1_ESM.doc (247 kb)
Supplementary material 1 (DOC 247 kb)

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Copyright information

© Springer-Verlag 2012

Authors and Affiliations

  • Yan Ren
    • 1
  • Zaifeng Li
    • 2
  • Zhonghu He
    • 1
    • 5
  • Ling Wu
    • 3
  • Bin Bai
    • 1
    • 4
  • Caixia Lan
    • 1
  • Cuifen Wang
    • 2
  • Gang Zhou
    • 4
  • Huazhong Zhu
    • 3
  • Xianchun Xia
    • 1
  1. 1.Institute of Crop Science, National Wheat Improvement Center/The National Key Facility for Crop Gene Resources and Genetic ImprovementChinese Academy of Agricultural Sciences (CAAS)BeijingChina
  2. 2.Department of Plant Pathology, College of Plant ProtectionAgricultural University of Hebei, Biological Control Center for Plant Diseases and Plant Pests of HebeiBaodingChina
  3. 3.Crop Research InstituteSichuan Academy of Agricultural SciencesChengduChina
  4. 4.Wheat Research InstituteGansu Academy of Agricultural SciencesLanzhouChina
  5. 5.International Maize and Wheat Improvement Center (CIMMYT) China Office, c/o CAASBeijingChina

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