Microchimica Acta

, Volume 132, Issue 1, pp 41–47 | Cite as

XRF Analysis of Microsamples of Semiconductor Type Multielement Materials by the Thin Layer Method. Determination of Cr, Co, Ni, Cu, Zn, Ga, Se, Sb, Yb

  • Jerzy Jurczyk
  • Rafał Sitko
  • Beata Zawisza
  • Franciszek Buhl
  • Ewa Malicka

Abstract

 A simple and quick method of durable samples preparation by the thin layer method through direct digesting of the analysed material on the substrate has been presented. Four- and three-component mono- and polycrystals have been analysed. Standards have been used in calibration containing: Cr, Co, Ni, Cu, Zn, Ga, Se, Sb, Yb. To improve the correlation between the concentration and the fluorescent radiation models of mathematical corrections have additionally been used: multiple linear regression, Lucas-Tooth-Pyne model (L. T. P.) and de Jongh model (d. J.).

Statistical parameters: detection limits for 0.5 mg samples: Cr–0.041%, Co–0.034%, Ni–0.042%, Cu–0.053%, Zn–0.054%, Ga–0.057%, Se–0.057%, Sb–0.113%, Yb–0.077%. Correlation coefficients: simple regression 0.9946–0.9997, multiple regression 0.9974–1.0000, L. T. P. 0.9993–1.0000, d. J. 0.9995–1.0000.

Key words: XRF analysis; thin layer method; mono- and polycrystals; semiconductor; microsamples. 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Copyright information

© Springer-Verlag Wien 1999

Authors and Affiliations

  • Jerzy Jurczyk
    • 1
  • Rafał Sitko
    • 1
  • Beata Zawisza
    • 1
  • Franciszek Buhl
    • 1
  • Ewa Malicka
    • 1
  1. 1.Institute of Chemistry, Silesian University, Katowice 40-006, PolandPL

Personalised recommendations