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Electron Beam Techniques for the Analysis of Fine Particles in the Minerals Industry

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This paper, adapted from a presentation in the joint TMS-SME symposium at the 1985 AIME Annual Meeting in New York, discusses the importance of mineralogical and chemical characterization of fine particles in mineral and metallurgical processing. The correct choice of instrument depending on particle size, composition, and nature of sample is stressed; and the analytical capabilities of different types of instruments are evaluated. Applications of electron beam equipment for surface analysis are mentioned and the paper concludes with a review of some recent work performed in the processing field.

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Additional information

Neil Rowlands received his Ph.D. in mining engineering from the University of Wales in 1977. He is currently Assistant Professor in the Mining and Metallurgical Engineering Department of McGill University, Quebec, Canada.

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Rowlands, N. Electron Beam Techniques for the Analysis of Fine Particles in the Minerals Industry. JOM 37, 16–19 (1985). https://doi.org/10.1007/BF03257702

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  • Pyrite
  • Jarosite
  • Scanning Transmission Electron Microscope
  • Leach Residue
  • Lead Sulfate