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Opportunities and limits of Hil-tests

Chancen und Grenzen von Hil-tests

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Abstract

The ever increasing networking of the control units requires optimized methods and processes to secure the electronics. One significant module for testing the electronics is the Hardware- in-the-Loop test (HiL-test)for electronic control units. The test is used to inspect the individual control units, to secure entire domains, right up to depicting the overall vehicle. This article presents the technology range used at ZF Friedrichshafen AG and assesses the inherent opportunities as well as limits.

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References

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    Krimmel, H.; Deiss, H.; Runge, W.; Schürr, H.: Elektronische Vernetzung von Antriebsstrang und Fahrwerk. In ATZ 108 (2006), Nr. 5

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    Dornseiff, M.; Stakl, M.; Sieger, M.; Sax, E.: Durchgängige Testmethoden für kompakte Steuersysteme — Optimierung der Prüftiefe durch effiziente Testprozesse. Elektronik im Kraftfahrzeug, Baden-Baden, 2001

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    Waltermann, H.; Schütte, K.; Diekstall, J.: Hardwarein-the-Loop-Test verteilter Kfz-Systeme. In ATZ 106 (2004), Nr. 5

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Krimmel, H., Maschmann, O., Seidt, S. et al. Opportunities and limits of Hil-tests. ATZ Elektron Worldw 1, 7–10 (2006). https://doi.org/10.1007/BF03242097

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Keywords

  • Control Unit
  • Test Bench
  • Test Scenario
  • Electronic Control Unit
  • Target Vehicle