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Magnetic property and interface structure of Ta/NiO/NiFe/Ta

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Abstract

Ta/NiO/NiFe/Ta multilayers, utilizing Ta as buffer layer, were prepared by rf reactive and dc magnetron sputtering. The exchange coupling field between NiO and NiFe reached a maximum value of 9.6 ×103 A/m at a NiO film thickness of 50 nm. The composition and chemical states at interface region of Ta/NiO/Ta were studied by using the Xray photoelectron spectroscopy (XPS) and peak decomposition technique. The results show that there is an “intermixing layer” at the Ta/NiO (and NiO/Ta) interface due to a thermodynamically favorable reaction 2Ta + 5NiO = 5Ni + Ta2O5. This interface reaction has a great effect on exchange coupling. The thickness of Ni+NiO estimated by XPS depthprofiles is about 8–10 nm.

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References

  1. 1.

    Hwang, D. G., Park, C. M., Lee, S. S., Exchange biasing in NiO spin valves, J. Magn. Magn. Mater., 1998, 186: 265.

  2. 2.

    Devasahayam, A. J., Kryder, M. H., A study of the NiFe/NiMn exchange couple, IEEE. Trans. Magn., 1996, 32(5): 4654.

  3. 3.

    Hamakawa, Y., Hoshiya, H., Kawabe, T. et al., Spin-valve heads utilizing antiferromagnetic NiO layers, IEEE. Trans. Magn., 1996, 32(1): 149.

  4. 4.

    Shen, J. X., Kief, M. T., Exchange coupling between NiO and NiFe thin film, J. Appl. Phys., 1996, 79(8): 5008.

  5. 5.

    Soeya, S., Fuyama, M., Tadokoro, S. et al., NiO structure-exchange anisotropy relation in the Ni81Fe19/NiO films and thermal stability of NiO film, J. Appl. Phys., 1996, 79(3): 1604.

  6. 6.

    Michel, R. P., Chaiken, A., Kim, Y. K. et al., NiO exchange bias layers grown by direction beam sputtering of a nickel oxide target, IEEE. Trans. Magn., 1996, 32(5): 4651.

  7. 7.

    Lai, C. H., Anthony, T. C., Iwamura, E. et al., The effect microstructure and interface conditions on the anisotropic exchange fields of NiO/NiFe, IEEE. Trans. Magn., 1996, 32: 3419.

  8. 8.

    Lai, C. H., Matsuyama, H., White, R. L. et al., Exploration of magnetization reversal and coercivity of epitaxial NiO {111}/NiFe films, J. Appl. Phys., 1996, 79(8): 6389.

  9. 9.

    Lin, T., Tsang, C., Fontana, R. E. et al., Exchange-coupled NiFe/Ni-Mn and NiO/Ni-Fe films for stabilization of magnetoresistive sensors, IEEE. Trans. Magn., 1995, 31(6): 2585.

  10. 10.

    Wagner, C. D., Riggs, W. M., Davis, L. E. et al., Handbook of Xray Photoelectron Spectroscopy, Minnesota: Perkin-Elmer Corporation, USA, 1979, 81, 144.

  11. 11.

    Kubaschewski, O., Alcock, C. B., Spencer, P. J., Materials of Thermochemistry, New York: Pergamon Press, 1993, 300, 312.

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Author information

Correspondence to Guanghua Yu.

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Yu, G., Chai, C., Zhu, F. et al. Magnetic property and interface structure of Ta/NiO/NiFe/Ta. Chin.Sci.Bull. 46, 438–440 (2001). https://doi.org/10.1007/BF03183284

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Keywords

  • NiO
  • interface reaction
  • X-ray photoelectron spectroscopy
  • exchange coupling