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Lettere al Nuovo Cimento (1971-1985)

, Volume 24, Issue 2, pp 33–38 | Cite as

X-Ray characterization of the anisotropy properties of thin films

  • G. Balestrino
  • S. Lagomarsino
  • F. Scarinci
  • A. Tucciarone
  • L. Mastrogiacomo
Article

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References

  1. (1).
    W. S. Hyler andR. L. Jackson: inResidual Stress in Metals and Metal Construction, edited byW. R. Osgood (New York, N. Y., 1954).Google Scholar
  2. (2).
    C. F. Jatczak andH. H. Boehm:Advances in X-Ray Analysis,17, 354 (1973).Google Scholar
  3. (3).
    E. Macherauch andU. Wolfstieg:Advances in X-Ray Analysis,20, 369 (1976).Google Scholar
  4. (4).
    A. J. C. Wilson:Mathematical Theory of X-Ray Powder Diffractometry (Eindhoven, 1963).Google Scholar
  5. (5).
    L. V. Azaroff, R. Kaplow, N. Kato, R. J. Weiss, A. J. C. Wilson andR. A. Young:X-Ray Diffraction (New York, N. Y., 1974).Google Scholar

Copyright information

© Società Italiana di Fisica 1979

Authors and Affiliations

  • G. Balestrino
    • 1
  • S. Lagomarsino
    • 1
  • F. Scarinci
    • 1
  • A. Tucciarone
    • 1
  • L. Mastrogiacomo
    • 1
  1. 1.Laboratorio di Elettronica dello Stato Solido del C.N.R.Roma

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