Faraday rotation, optical isolation and modulation at 10.6 μm using hot-pressed CdCr2S4 and CoCr2S4
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Abstract
Measurements performed on hot-pressed samples of ferromagnetic CdCr2S4 and ferrimagnetic CoCr2S4 indicate that they would be useful as optical isolators and modulators for CO2 lasers at 10.6 μm. Based on the Faraday effect, large aperture devices could be fabricated which would operate under modest cooling and drive power requirements. The various figures of merit needed to evaluate the performance of these materials as isolators and modulators have been determined optically with a low power CO2 laser. D.C. applied magnetic fields were used to determine the variations in measured Faraday rotation as a function of sample thickness. Figures of merit pertinent to isolation were also obtained, such as the passive extinction ratio and forward to backward transmitted energy ratio. A.C. applied magnetic fields were used to determine the frequency response of the materials, their modulation depths, and drive powers up to 100 kHz. Short duration pulses were used to analyze higher frequency behavior.
Key words
Optical modulation Optical isolation CO2 laser Faraday rotation Hot-pressed CdCr2S4 and CoCr2S4Preview
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References
- 1.J. F. Lotspeich, Appl. Opt.13, 2529 (1974).Google Scholar
- 2.D. Pearlman, E. Carnall, Jr., and T. W. Martin, J. Sol. State Chem.7, 138 (1973).CrossRefGoogle Scholar
- 3.D. Pearlman, E. Carnall, Jr., and T. W. Martin, J. Solo State Chem.9, 165 (1974).CrossRefGoogle Scholar
- 4.F. Moser, R. K. Ahrenkiel, E. Carnall, T. Coburn, S. L. Lyu, T. H. Lee, T. Martin, and D. Pearlman, J. Appl. Phys.42, 1449 (1971).CrossRefGoogle Scholar
- 5.T. J. Coburn, F. Moser, R. K. Ahrenkiel, K. J. Teegarden, IEEE Trans. Mag.MAG-7, 392 (1971).CrossRefGoogle Scholar
- 6.E. Carnall, Jr., D. Pearlman, T. J. Coburn, F. Moser, T. W. Martin, Mat. Res. Bull.7, 1361 (1972).CrossRefGoogle Scholar
- 7.S. Wittekoek and P. F. Bongers, IBM J. Res. Develop.14, 312 (1970).CrossRefGoogle Scholar
- 8.T. H. Lee, Research Laboratories, Eastman Kodak Company; private communication.Google Scholar
- 9.E. Oarnall, Jr., Research Laboratories, Eastman Kodak Company; private communication.Google Scholar
- 10.S. D. Jacobs, K. J. Teegarden, R. K. Ahrenkiel, Applo Opt.13, 2313 (1974).CrossRefGoogle Scholar
- 11.W. T. Board, Yoh-Han Pao, F. W. Phelps, Jr., P. C. Claspy, IEEE J. Quantum ElectronicsQE-10, 273 (1974).CrossRefGoogle Scholar
- 12.W. E. Bicknell, L. R. Tomasetta, T. H. Bates, from digest of Technical Papers-VIII International Quantum Electronics Conference, June 10–13, 1974.Google Scholar
- 13.H. W. Lehmann and M. Robbins, J. Appl. Phys.37, 1389 (1966).CrossRefGoogle Scholar
- 14.R. K. Ahrenkiel, F. Moser, E. Carnall, T. Martin, D. Pearlman, S. L. Lyu, T. Coburn, and T. H. Lee, Appl. Rhys. Lett.18, 171 (1971).CrossRefGoogle Scholar
- 15.S. H. Wemple, J. F. Dillon, Jr., L. G. Van Uitert, and W. H. Grodkiewics, Appl. Phys. Lett.22, 331 (1973).CrossRefGoogle Scholar
- 16.H. Takeuchi, S. Ito, I. Mikami, and S. Taniguchi, J. Appl. Phys.44, 4789 (1973).CrossRefGoogle Scholar