Journal of Radioanalytical Chemistry

, Volume 64, Issue 1–2, pp 195–212 | Cite as

Advances in accelerator based analysis techniques

  • E. A. Schweikert
Novel Applications of Accelerators
Received:

Abstract

Various ion beam techniques (E≥1 MeV/amu) are compared from the standpoint of their analytical capabilities: Charged Particle Activation Analysis (CPAA), Particle Induced X-Ray Emission (PIXE), Ion Induced γ-Ray Emission for bulk analysis, Prompt Reaction Analysis (PRA), Rutherford Backscattering Spectrometry for surface layer characterization and ion absorptiometry for microscopic analysis. With CPAA and PIXE≥70 elements can be detected with sub-ppm sensitivity. The scope of CPAA is being extended with heavy ion beams for radioactivation of H, He, Li, Be, B, C isotopes. In surface layer characterization recent developments in PRA and RBS also involve heavy ion beams. In RBS they can significantly enhance mass resolution for M>50 in comparison with α scattering. For example,63Cu and65Cu can be quantitatively identified in surface films using a 1 MeV/amu40Ar beam. In microscopic analysis, the nuclear microprobe can provide atom-specific signals from quantities ≥10−12 g on spots of a diameter ≥2 μm. Ion absorptiometry techniques can sense density variations as low as ±0.5% in 1 μm3 or less of sample volume.

Keywords

Tritium Rutherford Backscatter Spectrometry Depth Resolution Copper Isotope Nuclear Microprobe 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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Copyright information

© Akadémiai Kiadó 1981

Authors and Affiliations

  • E. A. Schweikert
    • 1
  1. 1.Center for Trace Characterization, Department of ChemistryTexas A&M UniversityCollege StationUSA

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