Journal of Radioanalytical Chemistry

, Volume 72, Issue 1–2, pp 79–88 | Cite as

Search for uranium in high purity silicon

  • W. D. James
  • C. E. Thompson
Materials Analysis
Received:

Abstract

Detection of small quantities of uranium in silicon wafers has been carried out by neutron activation followed by observation of fission product140La. Irradiations of about one week were made at a flux of 6·1014n cm−2 s−1 and the activity of the 1596 keV line was determined. Counting rates of as low as 1 count per minute have been observed. This indicates uranium concentrations of about 5·1010 atoms per cubic centimeter of silicon or about 0.01 mg/g, assuming activity from other fissionable nuclides to be negligible.

Keywords

Uranium Fission Product Uranium Concentration Float Zone High Purity Silicon 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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Copyright information

© Akadémiai Kiadó 1982

Authors and Affiliations

  • W. D. James
    • 1
  • C. E. Thompson
    • 2
  1. 1.Center for Trace Characterization Texas A&M University College StationUSA
  2. 2.Burroughs Corporation San DiegoUSA

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