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Il Nuovo Cimento D

, Volume 15, Issue 2–3, pp 451–457 | Cite as

The transport and switching of Xe atoms on the Ni-W interface of a scanning tunnelling microscope

  • F. Flores
  • J. R. Cerdá
  • P. L. de Andres
  • P. M. Echenique
Article

Summary

The transport and switch of Xe atoms on the Ni-W interface of a scanning tunnelling microscope have been analysed for different geometries as a function of the tip position with respect to the Ni(110) surface. Our results show that the control of the different experimental results can only be achieved by a precise control of the position of the tip on the sample. In particular, the tip-sample Xe switch can only be obtained within tip heights of 0.2Å.

PACS 61.16.Di

Electron microscopy determinations (including scanning tunneling electron microscopy methods) 

PACS 66.90

Other topics in nonelectronic transport properties 

PACS 68.35.Bs

Geometry atomic and molecular orientation crystal shapes surface topography 

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Copyright information

© Società Italiana di Fisica 1993

Authors and Affiliations

  • F. Flores
    • 1
    • 2
  • J. R. Cerdá
    • 1
    • 2
  • P. L. de Andres
    • 1
    • 2
  • P. M. Echenique
    • 3
  1. 1.Departmento de Física de la Materia Condensada, C-XII, Facultad de CienciasUniversidad Autónoma de MadridMadridSpain
  2. 2.Instituto de Ciencia de Materiales, Consejo Superior de Investigaciones Científicas c/Serrano 144MadridSpain
  3. 3.Departmento de Física de Materiales, Apdo 1072, Facultad de QuímicasEuskal Herriko Unibertsitatea/UPVSan Sebastian-EuskadiSpain

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