Hyperfine Interactions

, Volume 62, Issue 1–2, pp 45–53 | Cite as

Study of the polymer surfaces with improved resolution FRES

  • M. H. Rafailovich
  • J. Sokolov
  • X. Zhao
  • R. A. L. Jones
  • E. J. Kramer
Article

Abstract

We have developed a time-of-flight detector system which improves the resolution of standard He+ forward recoil spectrometry (FRES) to better than 300 Å. The technique was used to determine the shape of the concentration profile at the surface of polymer blends of deuterated polystyrene (d-PS) and protonated polystyrene (PS). The results are discussed in terms of the predictions of mean field theories.

Keywords

Polymer Thin Film Field Theory Polystyrene Detector System 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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Copyright information

© J.C. Baltzer A.G. Scientific Publishing Company 1990

Authors and Affiliations

  • M. H. Rafailovich
    • 1
  • J. Sokolov
    • 1
  • X. Zhao
    • 1
  • R. A. L. Jones
    • 2
  • E. J. Kramer
    • 2
  1. 1.Department of PhysicsQueens CollegeFlushingUSA
  2. 2.Department of Materials Science and Engineering, and Materials Science CenterCornell UniversityIthacaUSA

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