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Volume diffusion of I anions in near surface region of copper

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Abstract

Volume diffusion of I anions in the near surface region of copper has been studied by radiotracer technique. The diffusion coefficients were determined for different I coverages on copper employing the Gruzin method of measuring the residual activity. Diffusion annealing was carried out between 303 and 673 K. The distribution of the I species in the diffusion-annealed sample was monitored by noting the residual activity of the specimen upon subjecting it to successive acid-etchings. The simultaneous evaporation losses from the I deposit are reduced by securely holding the sample coupon in between two blank copper coupons using a metal clip.

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Daniels, E.A., Reddi, P.G. Volume diffusion of I anions in near surface region of copper. Journal of Radioanalytical and Nuclear Chemistry Letters 153, 37–46 (1991). https://doi.org/10.1007/BF02170246

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Keywords

  • Copper
  • Physical Chemistry
  • Evaporation
  • Inorganic Chemistry
  • Diffusion Coefficient