Radionuclide X-ray fluorescence analysis was used for the determination of Cu, Y and Ba in very thin high-temperature superconducting films. The precision of the method is better than 3% for about 1 μm thick films. The atomic emission ICP spectrometry was used to testify results of XRF analysis. An acceptable agreement of both methods was obtained.
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Kliment, V. Analysis of high-temperature superconducting films by X-ray fluorescence analysis. Journal of Radioanalytical and Nuclear Chemistry Letters 155, 91–95 (1991). https://doi.org/10.1007/BF02165062
- Physical Chemistry
- Inorganic Chemistry
- Thick Film
- Atomic Emission