Frequency-dependent characteristics of thick microstrip lines in lossy multilayered dielectric media

  • J. R. Souza
Article
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Abstract

The Spectral Domain Approach (SDA) is used for a rigorous full-wave analysis of thick microstrip lines embedded in lossy multilayered dielectric media. The effects of the conductor thickness on the propagation constant and characteristic impedance are investigated.

Keywords

Characteristic Impedance Dielectric Medium Spectral Domain Microstrip Line Domain Approach 
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References

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Copyright information

© Plenum Publishing Corporation 1993

Authors and Affiliations

  • J. R. Souza
    • 1
  1. 1.Center for Telecommunication Studies-CETUCPontifical Catholic University of Rio de Janeiro-PUC/RioRio de Janeiro-RJBrazil

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