Advertisement

Springer Nature is making SARS-CoV-2 and COVID-19 research free. View research | View latest news | Sign up for updates

AES studies of slip lines in silicon carbide (0001) surface

This is a preview of subscription content, log in to check access.

References

  1. 1.

    D. KUHLMANN,Z. Metallkde 41 (1950) 129.

  2. 2.

    A. F. BROWN,Adv. Phys. 1 (1952) 427.

  3. 3.

    R. MADDIN and N. K. CHEN,Prog. Metal Phys. 5 (1954) 53.

  4. 4.

    P. H. HOLLOWAY, “Advances in Electronics and Electron Physics”, Vol. 54, (Academic, 1980) p. 241.

  5. 5.

    M. P. SEAH,Surf. Sci. 53 (1975) 168.

  6. 6.

    C. LEA,Met. Sci. 3 (1979) 301.

  7. 7.

    H. J. GRABKE,Mater. Sci. Engng 42 (1980) 91.

  8. 8.

    C. LEA and E. D. HONDROS,Proc. R. Soc. A377 (1981) 477.

  9. 9.

    E. HONDROS and C. LEA,Nature 289 (1981) 663.

  10. 10.

    F. SEITZ, in Proceedings of Symposium on Plastic Deformation of Crystalline Solids, Pittsburg (1950) p. 153.

  11. 11.

    P. MORGEN, K. L. SEAWARD and T. W. BARBEE Jr,J. Vac. Sci. Technol. A3 (1985) 2108.

  12. 12.

    J. W. FAUST, Jr, “Silicon Carbide” (Pergamon, 1960) p. 403.

Download references

Author information

Rights and permissions

Reprints and Permissions

About this article

Cite this article

Suleman, M., Salah-Ud-Din AES studies of slip lines in silicon carbide (0001) surface. J Mater Sci Lett 5, 1285–1286 (1986). https://doi.org/10.1007/BF01729394

Download citation

Keywords

  • Polymer
  • Silicon
  • Carbide
  • Silicon Carbide
  • Slip Line