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Zum Stromrauschen von Halbleitern

  • Willy Baumgartner
  • Hans Ulrich Thoma
Kurze Mitteilungen

Summary

The wellknown trapping of electrons and holes seems to give an explanation of the current noise in semiconductors. It is pointed out how especially the magnitude and low frequency dependence of the noise power can be understood; the possibility of a strong correlation between low frequency noise and photoconductive properties of semiconductors is emphasized.

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References

  1. 2).
    A. van der Ziel, Physica16, 359 (1950).K. W. Boer, Ann. Phys., 6. Folge,14, 87 (1954).D. K. C. McDonald, Rep. Prog. Phys.12, 56 (1949).Google Scholar
  2. 3).
    J. H. Gisolf, Physica15, 825 (1949).Google Scholar

Copyright information

© Birkhäuser Verlag 1955

Authors and Affiliations

  • Willy Baumgartner
    • 1
  • Hans Ulrich Thoma
    • 1
  1. 1.Abteilung für industrielle Forschung des Instituts für technische Physik der ETHZürich

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