Note on the interpretation of injection-level-dependent surface recombination velocities
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The surface recombination velocityS=U/n is defined as the ratio between the surface recombination current densityU and the excess minority carrier concentrationn at the semiconductor surface. Measurements of injection-dependent surface recombination velocities apply modulation techniques, and thus, in reality, a differential surface recombination velocitySdiff=dU/dn is determined. The significance to distinguishS andSdiff when evaluating measurements is shown.