Applied Physics A

, Volume 61, Issue 2, pp 159–161 | Cite as

Photothermal deflection spectroscopy of polymer thin films

  • S. K. So
  • M. H. Chan
  • L. M. Leung


Photothermal Deflection Spectroscopy (PDS) is known to be one of the most sensitive techniques for measuring the absorption of weakly absorbing materials. We have applied PDS for measuring the optical absorption of a few polymer thin-film samples over the wavelength region from 0.4–2.0 μm. The results are useful for optical evaluation of these polymers.


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Copyright information

© Springer-Verlag 1995

Authors and Affiliations

  • S. K. So
    • 1
  • M. H. Chan
    • 1
  • L. M. Leung
    • 2
  1. 1.Department of PhysicsHong Kong Baptist UniversityKowloonHong Kong
  2. 2.Department of ChemistryHong Kong Baptist UniversityKowloonHong Kong

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