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Angular distribution of photo electrons from above-threshold-ionization (ATI) of xenon by 532 nm, 355 nm and 266 nm radiation

  • D. Feldmann
  • D. Petring
  • G. Otto
  • K. H. Welge
Article

Abstract

A time-of-flight electron energy spectrometer has been used to measure the angular distributions of photoelectrons emitted after the absorption of up to four excess photons above the ionization threshold of Xenon at 532 nm. For shorter wavelength less efficient ATI is observed. The shape of the angular distributions and the branching ratios for the two ionic fine structure states Xe+(2P3/2) and Xe+(2P1/2) may be plausibly attributed to the influence of excited states of the atom.

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References

  1. 1.
    Multiphoton ionization of atoms. Chin, S.L., Lambropoulos, P. (eds.) New York: Academic Press 1984Google Scholar
  2. 2.
    Multiphoton Processes. In: Springer series on atoms and plasmas. Lambropoulos, P., Smith, S.J. (eds.) Vol. 2. Berlin, Heidelberg, New York: Springer 1984Google Scholar
  3. 3.
    Fundamentals of laser interaction. In: Lecture notes in physics. Ehlotzky, F. (ed.) Vol.229, Berlin, Heidelberg, New York: Springer 1985Google Scholar
  4. 4.
    Kruit, P., Kimman, J., Muller, A.G., van der Wiel, M.J.: Phys. Rev. A28, 248 (1983);Google Scholar
  5. 4a.
    Kruit, P., Kimman, J., van der Wiel, M.J.: J. Phys. B14, L597 (1981);Google Scholar
  6. 4b.
    Agostini, P., Clement, M., Fabre, F., Petite, G.: J. Phys. B14, L491 (1981);Google Scholar
  7. 4c.
    Petite, G., Fabre, F., Agostini, P., Crance, M., Aymar, M.: Phys. Rev. A29, 2677 (1984); and contributions in Refs. [1]-[3]Google Scholar
  8. 5.
    Müller, H.G.: Thesis, University of Amsterdam, and Refs. thereinGoogle Scholar
  9. 6.
    Fabre, F., Agostini, P., Petite, G., Clement, M.: J. Phys. B14, L677 (1981)Google Scholar
  10. 7.
    Hippler, R., Humpert, H.J., Schwier, H., Jetzke, S., Lutz, H.O.: J. Phys. B16, L713 (1983)Google Scholar
  11. 8.
    Humpert, H.J., Schwier, H., Hippler, R., Lutz, H.O.: Phys. Rev. A32, 3787 (1985); Feldmann, D., Wolf, B., Wemhöner, M., Welge, K.H. (to be published)Google Scholar
  12. 9.
    Rzazewski, K., Grobe, R.: Phys. Rev. A33, 1855 (1986)Google Scholar
  13. 10.
    Lompre, L.A., Mainfray, G.: p. 23, Ref. [2]Google Scholar
  14. 11.
    Feldmann, D., Otto, G., Petring, D., Welge, K.H.: J. Phys. B19, 269 (1986)Google Scholar
  15. 12.
    Freeman, R.R., McIlrath, T.J., Bucksbaum, P.W., Bashkanski, M.: Phys. Rev. Lett.57, 3156 (1986)Google Scholar
  16. 13.
    Moore, C.E.: Atomic energy levels III: Circular NBS, USA 467 (1958)Google Scholar
  17. 14.
    Gangopadhyay, P., Tang, X., Lambropoulos, P., Shakeshaft, R.: Phys. Rev. A34, 2998 (1986)Google Scholar
  18. 15.
    Lambropoulos, P.: (Private Communication)Google Scholar
  19. 16.
    Dulcic, A., Eberly, J.H.: (Private Communication) (to be published)Google Scholar
  20. 17.
    Petite, G., Fabre, F., Agostini, P., Crance, M., Aymar, M.: Phys. Rev. A29, 2677 (1984)Google Scholar

Copyright information

© Springer-Verlag 1987

Authors and Affiliations

  • D. Feldmann
    • 1
  • D. Petring
    • 1
  • G. Otto
    • 1
  • K. H. Welge
    • 1
  1. 1.Fakultät für PhysikUniversität BielefeldBielefeldFederal Republic of Germany

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