Zeitschrift für Physik B Condensed Matter

, Volume 97, Issue 1, pp 139–146 | Cite as

Scattering of conduction electrons by surface roughness in thin metal films

  • A. Kaser
  • E. Gerlach
Original Contributions
Received:
Revised:

Abstract

A fluctuation transport theory is applied to describe the extra resistivity of thin metal films due to electron scattering at rough surfaces. This scattering mechanism is described in terms of the surface profile autocorrelation. If the lateral extension of the surface structures exceeds the Fermi wavelength, the scattering can be described by a step density of terrace edges.

PACS

72.10 73.25 73.60D 
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Copyright information

© Springer-Verlag 1995

Authors and Affiliations

  • A. Kaser
    • 1
  • E. Gerlach
    • 1
  1. 1.VI. Physikalisches InstitutRWTH-AachenAachenGermany

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