A dense pattern of very fine crazes may be observed in unoriented and pre-oriented PC samples drawn to high stresses and strains. Scanning electron microscopy clearly revealed the microstructure of these crazes which are composed of fibrils of considerably larger diameters than those normally observed.
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Dedicated to C. C. Hsiao and J. A. Sauer on the occasion of the 30th anniversary of the publication of their paper: “On Crazing of Linear High Polymers”
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Dettenmaier, M., Kausch, H.H. Some observations by scanning electron microscopy on a new craze phenomenon in bisphenol-A polycarbonate. Polymer Bulletin 3, 571–578 (1980). https://doi.org/10.1007/BF01135325
- Electron Microscopy
- Scan Electron Microscopy