Journal of Materials Science

, Volume 23, Issue 11, pp 3843–3846 | Cite as

Contact electron micrography for characterization of paper in a transmission electron microscope: a new technique

  • A. V. Moharir
  • Nam Prakash
Article
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Accepted:
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Abstract

Modern electron microscopes are usually fitted with a plate camera system for recording high-resolution electron micrographs. In this paper a simple method of using this plate camera for recording a contact micrograph of thin paper on photographic cut sheet, using accelerated electrons at 80 to 100kV in a Philips transmission electron microscope has been described and discussed. Results indicate that the scattered electrons through the sheet of paper do record the structural morphology and help in characterization of paper and its quality. In addition to paper technology, this technique may find potential applications in polymer film and solid state industries and several other areas which require characterization of thin specimens.

Keywords

Polymer Electron Microscope Transmission Electron Microscope Solid State Potential Application 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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Copyright information

© Chapman and Hall Ltd. 1988

Authors and Affiliations

  • A. V. Moharir
    • 1
  • Nam Prakash
    • 1
  1. 1.Nuclear Research LaboratoryIndian Agricultural Research InstituteNew DelhiIndia

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