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Journal of Materials Science

, Volume 24, Issue 5, pp 1617–1622 | Cite as

Composition and microstructure of silicon carbide whiskers

  • Keith R. Karasek
  • Steven A. Bradley
  • Jeffry T. Donner
  • Michael R. Martin
  • Kevin L. Haynes
  • Harry C. Yeh
Papers

Abstract

The bulk and surface chemistries of four sets of commercially available SiC whiskers made by three manufacturers were determined. The oxygen content varied significantly, ranging in the bulk from 1.9 to 0.6 at.% and on the surface from 35 to 15 at.%. Surface analysis as obtained by X-ray photoelectron spectroscopy also indicated that the oxygen species differed significantly with whisker supplier; each of three of the whisker sets contained a surface species that is very similar to that found in a Si-O-C glass, while one whisker surface appeared to have a silica-rich surface. Surface carbon concentrations varied significantly, while silicon concentrations did not. Scanning transmission electron micrographs indicate significant morphological variations (i.e., twinning, branching, kinks, surface roughness, etc.) occur in all of the whisker types.

Keywords

Carbide Surface Roughness Silicon Carbide Morphological Variation Carbon Concentration 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Chapman and Hall Ltd. 1989

Authors and Affiliations

  • Keith R. Karasek
    • 1
  • Steven A. Bradley
    • 1
  • Jeffry T. Donner
    • 1
  • Michael R. Martin
    • 2
  • Kevin L. Haynes
    • 2
  • Harry C. Yeh
    • 2
  1. 1.Allied-Signal Engineered Materials Research CenterDes PlainesUSA
  2. 2.Ceramic Components DivisionGarrett Processing Co.TorranceUSA

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