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M. S. Bershtein and A. M. Romankevich, “A statistical-monitoring method for logic circuits,” Kibernetika, No. 1 (1974).
Seventh International Symposium on Fault-Tolerant Computing, FTCS-7, New York (1977).
K. P. Parker, “Compact testing: testing with compressed data,” 6th International Symposium on Fault-Tolerant Computing, FTCS-6, Pittsburgh (1976).
M. S. Bershtein and A. M. Romankevich, “Statistical monitoring of multicycle circuits,” Avtom. Vychisl. Tekh., No. 2 (1975).
M. S. Bershtein, “Statistical distinction of faults in combinational circuits,” Kibernetika, No. 3 (1976).
J. Gordon and G. Nadig, “Use of hexadecimal key codes in localizing faults in microprocessor systems,” Elektronika, No. 5 (1977).
M. S. Bershtein and A. M. Romankevich, “Synthesis of statistical tests for combinational circuits,” in: Proceedings of the Fourth All-Union Conference on Homogeneous Computing Systems and Enviroments [in Russian], Vol. 3, Kiev (1975).
Translated from Kibernetika, No. 4, pp. 53–56, July–August, 1979.
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Bershtein, M.S. Output-signal processing algorithms in statistical checking of logic circuits. Cybern Syst Anal 15, 493–497 (1979). https://doi.org/10.1007/BF01068898
- Operating System
- Artificial Intelligence
- System Theory
- Processing Algorithm
- Logic Circuit