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A vector measurement scheme for testing quasi-optical components

  • A. Roberts
  • R. C. Compton
Article

Abstract

A quasi-optical vector network analyzer has been developed and used to conduct a study of the complex reflection coefficients of planar structures. Good agreement has been obtained between theory and experiment for both amplitude and phase measurements at millimeter/microwave frequencies. A narrow band filter consisting of an array of annular slots in a metallic screen with a transmission peak at 35 GHz has been fabricated and tested over the range 26.5–40 GHz.

Keywords

Reflection Network Analyzer Reflection Coefficient Narrow Band Planar Structure 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Publishing Corporation 1990

Authors and Affiliations

  • A. Roberts
    • 1
  • R. C. Compton
    • 1
  1. 1.School of Electrical EngineeringCornell UniversityIthaca

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