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Untersuchung von Wolfram-Oberflächen mit Sekundärionen und thermischen Ionen in einem abbildenden Massenspektrometer

Analysis of tungsten surfaces in an imaging mass spectrometer by means of secondary and thermionic ions

Abstract

Mass spectra of positive and negative secondary and thermionic ions from a polycrystalline tungsten surface are recorded using an imaging secondary ion mass spectrometer. Micrographs showing the local emission density of positive secondary ions of tungsten and potassium and of thermally released potassium ions are compared with each other.

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Prager, M., Gaukler, K.-. Untersuchung von Wolfram-Oberflächen mit Sekundärionen und thermischen Ionen in einem abbildenden Massenspektrometer. Appl. Phys. 4, 327–331 (1974). https://doi.org/10.1007/BF00928387

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Index Headings

  • Surface analysis
  • Secondary ion emission
  • Thermionic ion emission